A test system for high speed VLSI array qualification

Hahn, Eike; Rolfes, T.J.; Zajkowski, P.J.

doi:10.1109/cicc.1988.20879

Proceedings of the IEEE 1988 Custom Integrated Circuits Conference

DOI: 10.1109/cicc.1988.20879

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A test system for high speed VLSI array qualification

Eike Hahn

T.J. Rolfes

P.J. Zajkowski

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A test system for high speed VLSI array qualification

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