1999
DOI: 10.1088/0965-0393/7/2/002
|View full text |Cite
|
Sign up to set email alerts
|

A three-dimensional photoresist etching simulator for TCAD

Abstract: Cellular Automata have been extensively used as a two-dimensional simulator of the photoresist etching process. This simulator has been verified experimentally for 248 nm photolithography. In this work the Cellular Automata simulator is extended in three dimensions in order to deal with problems arising in 193 nm photolithography and beyond. The three-dimensional simulator is tested using well known etch-rate distribution functions and its results are compared with experimental results found in the literature.

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
1
1
1

Citation Types

0
19
0

Year Published

2004
2004
2018
2018

Publication Types

Select...
3
3

Relationship

0
6

Authors

Journals

citations
Cited by 16 publications
(19 citation statements)
references
References 17 publications
0
19
0
Order By: Relevance
“…In addition to the proven level of accuracy, the CA technique is straightforward in implementation as it allows the user to employ regular and uniform spatial and temporal discretization in modeling the physical system. A modified three dimensional CA algorithm that follows closely, to the one proposed by Karafyllidis [Karafyllidis, 1999] is employed here. The exposed photoresist domain is divided into identical cubic CA cells, each with edge length a.…”
Section: Theoretical Modelmentioning
confidence: 99%
See 1 more Smart Citation
“…In addition to the proven level of accuracy, the CA technique is straightforward in implementation as it allows the user to employ regular and uniform spatial and temporal discretization in modeling the physical system. A modified three dimensional CA algorithm that follows closely, to the one proposed by Karafyllidis [Karafyllidis, 1999] is employed here. The exposed photoresist domain is divided into identical cubic CA cells, each with edge length a.…”
Section: Theoretical Modelmentioning
confidence: 99%
“…The modified 3D CA model is evaluated using a homogeneous etch-rate distribution function [Karafyllidis, 1999] to determine the values of γ edg and γ vtx in Eq (5) and Eq (6) and their effectiveness to describe the effects from the edge and vertex cells. The cells are assigned the same development rate value.…”
Section: Homogenous Development Rate Testmentioning
confidence: 99%
“…With the development of the computer technology, CA exhibits some advantages such as high accuracy. CA has been successfully adopted to simulate the lithography process [8,12] , silicon anisotropic etching process [13] , tumor growth [14] , etc.…”
Section: Cellular Automatamentioning
confidence: 99%
“…The ray-tracing model is also fast, but it has a great weakness that there are probably regions in the photoresist not reached by the choice of initial rays. Compared with other models, the CA models are both stable and accurate [8] .…”
mentioning
confidence: 96%
See 1 more Smart Citation