A unified multiple stress reliability model for microelectronic devices — Application to 1.55 μm DFB laser diode module for space validation

Bensoussan, Alain; Suhir, Ephraïm; Henderson, Philip; Zahir, Mustapha

doi:10.1016/j.microrel.2015.06.093

Cited by 9 publications

(4 citation statements)

References 25 publications

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“…To model the resultant changes in ex-fibre power Pout, we follow [11] wherein the Eyring law of Equation 1b is extended via the so-called Boltzmann-Arrhenius-Zhurkov (BAZ) model. Hence, the time to failure τ for the combined action of an elevated temperature T and external stress represents S is written as in Equation 1c.…”

Section: Icso 2018 International Conference On Space Opticsmentioning

confidence: 99%

Space validation of 1550nm DFB laser diode module

Henderson

Norman

MacDougall

et al. 2019

International Conference on Space Optics — ICSO 2018

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Following a program funded by the European Space Agency, a novel laser-diode module has been created and tested to ESCC-23201-compliant space standards. Manufactured by Gooch & Housego, the module is set for imminent entry to the European space market for use in optical signal-processing and telecom systems. Emission is from a 1550nm DFB semiconductor laser diode driven at constant nominal current and temperature. Combined with a wavelength stability of better than ±0.1nm and internal data rate of up to 3.2GHz, innovative sub-design and packaging provides for a unique power capability comprising a start-of-life ex-fibre power of >90mW and a typical electric power consumption that, at <4.1W, is down to 25% of that of similar products. Validation testing by AdvEOTec (France) indicates a comprehensive set of space compliances such as in proton irradiation, humidity, hot/cold storage, rapid depressurisation, vibration and 1,000g shock, as well as immunity to ±8kV of ESD, 10-5 mbar of vacuum, and 100krad of gamma irradiation. Unique methodologies for life-test modelling and production screening, established by Thales Alenia Space (France), provisionally confirm a 15-year space-compliant operating life. Space-compliant product, as presented, is intended to be supplied for a period of at least 5 years.

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Section: Icso 2018 International Conference On Space Opticsmentioning

confidence: 99%

Space validation of 1550nm DFB laser diode module

Henderson

Norman

MacDougall

et al. 2019

International Conference on Space Optics — ICSO 2018

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“…Similarly to this physical law, electronic reliability prediction presented in paper [1] will postulate that the initial state of the component is corresponding to healthy devices considered electrically "good" within its specification limits and the final state of the component corresponds to out of specification limit devices then considered as failed.…”

Section: Characterization/modeling Of Reliability and Life Time Expecmentioning

confidence: 99%

A methodologic project to characterize and model COTS component reliability

Durier

Bensoussan

Zerarka

et al. 2015

Microelectronics Reliability

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OATAO is an open access repository that collects the work of Toulouse researchers and makes it freely available over the web where possible. This is an author-deposited version published in : http://oatao.univ-toulouse.fr/ Eprints ID : 18034 The industries of transportation as the space industry are faced with a strong global economic competition which sets economic constraints on the cost of the functions. The use of COTS (Commercial Off-The-Shelf) components in embedded systems is more and more necessary to shorten the development cycles and reduce manufacturing costs. The application of electronic components comes overwhelmingly from public sectors whose requirement is to provide, in short development cycles, technological innovations including risk and cost mitigation. These development cycles must incorporate the specific constraints of embedded systems in terms of reliability, dependability, and availability, held in harsh environment and life. Due to the low volume of components supplying the market of embedded systems, component manufacturers are unlikely to provide information necessary to supporting folders for certification or qualification. It is therefore necessary for the Space, Aeronautics and Automotive industries to characterize the performance and robustness of these COTS components in the operational and environmental conditions of their applications. This paper presents the objectives and main challenges of a sponsored project dedicated to characterize and model COTS reliability.

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“…Using accelerated stability tests of a product under accelerated stress within a short time frame like a few months to estimate the shelf life at ambient conditions will be very imminent and economical. Theoretical models or empirical regressed mathematical equations have been extensively explored to achieve this goal. − Accelerated stability test conditions in pharmaceutical and nutraceutical areas are typically high temperature and high humidity levels above ambient conditions. For example, the ICH (the International Council for Harmonization of Technical Requirements for Pharmaceuticals for Human Use) guideline stipulates that the accelerated condition is 40 °C/75% RH (relative humidity), and the ambient condition is 25 °C/60% RH.…”

Section: Introductionmentioning

confidence: 99%

Degradation of Materials and Products Described with Eyring’s Rate Process Theory

Hao

2024

ACS Sustainable Resour. Manage.

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Generic degradation equations are derived in this article based on Eyring's rate process theory by assuming that the degradation process is a chemical reaction process and obeys Eyring's rate process theory. The stresses that may induce degradations such as temperature, humidity, photonic, etc. are considered reactants participating in the reaction. The obtained equations are not bound to a specific material or product, and the stress elements that induce degradation can be single or multiple, ranging from mechanical strength, photo, humidity, electrical current, etc. They are compared with theoretically derived and empirically regressed equations in the literature. Good agreements are found between our equations and the experimental data of biological samples, like blood and protein, vitamin C, and photovoltaic modules. The correlations between the accelerated stability data and the ambient ones are provided, which can be used to predict the shelf life. Our work not only provides a universal degradation mechanism among seemingly unrelated materials/products but also offers a practical tool to assign a shelf life of a product using accelerated stability data.

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A unified multiple stress reliability model for microelectronic devices — Application to 1.55 μm DFB laser diode module for space validation

Cited by 9 publications

References 25 publications

Space validation of 1550nm DFB laser diode module

Space validation of 1550nm DFB laser diode module

A methodologic project to characterize and model COTS component reliability

Degradation of Materials and Products Described with Eyring’s Rate Process Theory

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