A versatile UHV transport and measurement chamber for neutron reflectometry under UHV conditions

Mohd, Amir Syed; Pütter, Sabine; Mattauch, Stefan; Koutsioubas, Alexandros; Schneider, H. A.; Weber, Alexander; Brückel, Thomas

doi:10.1063/1.4972993

Cited by 9 publications

(2 citation statements)

References 17 publications

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“…reflectivities were measured under ultra high vacuum (UHV) condition (Figure 8a) and in ambient air (Figure 8b) [58]. Magnetic and nuclear SLDs were obtained by fitting the measured data as shown in Figure 8c and d for PNR measured in UHV and in air, respectively.…”

Section: Depth Profiling In Thin Films and Multilayersmentioning

confidence: 99%

Neutron Diffraction and Reflectometry: A Review on Unique Role in Functional Magnetic Materials

Mohd Amir,

Kumar

2024

Nanotechnology and Nanomaterials

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Magnetic materials either in bulk or thin films are ubiquitous in our daily life. Technology based on magnetic materials range from chunk of bulk ferromagnet to thin film spintronics. In solid state bulk materials, information about its magnetic structure together with crystal structure is absolutely necessary to manipulate them in applications. Neutron diffraction is an important tool to determine atomic magnetic moments and its directions at the lattice site in the magnetic unit cell. It also investigates the type of magnetic ordering in conventional as well as new exotic materials. Magnetic thin films are engineered materials in which nanometer or sub-nanometer thickness scale films are grown. At such thicknesses nanoscale magnetic properties are fundamentally different than its bulk counterpart. Neutron reflectometry is a unique tool to investigate nano-magnetism in thin films. Moreover, in multilayer thin films generally used for spintronics, polarized neutron reflectometry is indispensable characterizing tool which investigates the magnetic properties in different layers and at the interfaces. In this chapter, we will introduce how neutron diffraction and reflectometry techniques play unique role in the investigation of magnetic structure and magnetic properties of functional bulk and nano-scale thin films.

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Section: Depth Profiling In Thin Films and Multilayersmentioning

confidence: 99%

Neutron Diffraction and Reflectometry: A Review on Unique Role in Functional Magnetic Materials

Mohd Amir,

Kumar

2024

Nanotechnology and Nanomaterials

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“…Hence, some approaches for in situ PNR exist: At the Jülich Centre for Neutron Science (JCNS) at the Heinz-Maier-Leibnitz Zentrum (MLZ) in Garching a molecular beam epitaxy (MBE) growth chamber was built that allows the transport of the produced sample from the dedicated laboratory to the neutron reflectometer MARIA using an evacuated transport chamber. This way the sample is not exposed to ambient conditions between deposition and measurement [8]. This approach allows one to specialize the deposition setup without compromising the task of thin film growth.…”

Section: Introductionmentioning

confidence: 99%

Design and realization of a sputter deposition system for the in situ- and in operando-use in polarized neutron reflectometry experiments

Schmehl

Mairoser

Herrnberger

et al. 2018

Nuclear Instruments and Methods in Physics Research Section A:

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We report on the realization of a sputter deposition system for the in situ-and in operando-use in polarized neutron reflectometry experiments. Starting with the scientific requirements, which define the general design considerations, the external limitations and boundaries imposed by the available space at a neutron beamline and by the neutron and vacuum compatibility of the used materials, are assessed. The relevant aspects are then accounted for in the realization of our highly mobile deposition system, which was designed with a focus on a quick and simple installation and removability at the beamline. Apart from the general design, the in-vacuum components, the auxiliary equipment and the remote control via a computer, as well as relevant safety aspects are presented in detail.

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Reflectometry with Polarized Neutrons on In Situ Grown Thin Films

Kreuzpaintner

Schmehl

Book

et al. 2021

Physica Status Solidi (b)

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Originating from the demand for obtaining depth‐resolved magnetization profiles from thin films and heterostructures, polarized neutron reflectometry (PNR) has developed into a unique research tool, which also finds application in the analysis of superconducting or soft matter thin films. While certain in situ sample environments such as gas‐loading or humidity cells were quickly realized after PNR first emerged, preparing and growing thin magnetic films directly in the neutron beam could only be realized in recent years. Herein, a dedicated insight is given on the history and development of in situ thin film growth capabilities for PNR, from early pioneering experiments to the present day. The scientific and technological challenges as well as the advances of neutron sources, neutronics, and data treatment that have led to its realization are highlighted together with the unique research opportunities that it provides and recently obtained experimental results.

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A versatile UHV transport and measurement chamber for neutron reflectometry under UHV conditions

Cited by 9 publications

References 17 publications

Neutron Diffraction and Reflectometry: A Review on Unique Role in Functional Magnetic Materials

Neutron Diffraction and Reflectometry: A Review on Unique Role in Functional Magnetic Materials

Design and realization of a sputter deposition system for the in situ- and in operando-use in polarized neutron reflectometry experiments

Reflectometry with Polarized Neutrons on In Situ Grown Thin Films

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