Conductive bridge resistance change (CBRAM) memory devices are one of the premier emerging technologies for nonvolatile memory. The application of these devices could overlap possible situations where they are expected to perform in environments containing X-ray radiation. This poses the question, how X-ray radiation affects the materials comprised within these devices, as well as the performance of the CBRAM devices. In this work, we studied the structural changes caused by a wide range X-ray radiation over thin Ge-Se films with composition ranging from Se rich to Ge rich, as well as X-ray induced Ag diffusion within these films. The results show that after the cessation of radiation, the Ge rich films undergo considerable structural modification while the other compositions did not exhibit substantial changes. X-ray stimulated Ag diffusion with formation of Ag-Se by-products occurred predominantly in the Se and Ge rich films. These effects influence the performance of the CBRAM devices, based on these films and their I-V characteristics, threshold voltage and endurance are presented and discussed in the context of the materials characterization findings of this work, performed by Raman spectroscopy, Energy dispersion spectroscopy and X-ray diffraction. 1 Introduction The photoinduced effects in chalcogenide glasses (ChG) induced by exposure to visible and UV light are studied in depth and are well documented [1,2]. Similarly to visible light, X-rays can have indirectly ionizing effects on chalcogenide glass films. However, due to the shorter wavelength, the energy of the X-rays will be very high, leading to unique structural changes [3]. This for example, opens the opportunity for applying the effect of interaction of X-rays with chalcogenide glasses for the formation of X-ray flat panel image detectors [4,5]. Their performance is based on the absorption of X-ray photons by the chalcogenide photoconductor (usually a-Se) which facilitates the direct conversion of X-ray photons to electric charges. The studies, performed in relation with these X-ray induced effects of photocurrent in the chalcogenide films, resulted in the establishment of a charge trapping model for