Aberration-Corrected Scanning Transmission Electron Microscopy: The Potential for Nano- and Interface Science

Pennycook, Stephen J.; Lupini, Andrew R.; Kadavanich, A. V.; MeBride, J. R.; Rosenthal, Sandra J.; Puetter, R. C.; Yahil, A.; Krivanek, Ondrej L.; Dellby, Niklas; Nellist, Peter D.; Duscher, Gerd; Wang, L. G.; Pantelides, S. T.

doi:10.3139/146.030350

Cited by 20 publications

(3 citation statements)

References 41 publications

Supporting

Mentioning

Contrasting

Order By: Relevance

“…Before aberration correction, detection of a single atom was a significant achievement (e.g., refs. [5][6][7][8], but now these observations are possible and are even becoming routine for a much wider range of materials (9)(10)(11). For a microscope equipped with a high-sensitivity aberration-corrected electron energy loss spectrometer, analytical detection of single atoms within a bulk solid has been reported (12).…”

mentioning

confidence: 99%

Depth sectioning with the aberration-corrected scanning transmission electron microscope

Borisevich

Lupini

Pennycook

2006

Proc. Natl. Acad. Sci. U.S.A.

236

157

View full text Add to dashboard Cite

The ability to correct the aberrations of the probe-forming lens in the scanning transmission electron microscope provides not only a significant improvement in transverse resolution but in addition brings depth resolution at the nanometer scale. Aberration correction therefore opens up the possibility of 3D imaging by optical sectioning. Here we develop a definition for the depth resolution for scanning transmission electron microscope depth sectioning and present initial results from this method. Objects such as catalytic metal clusters and single atoms on various support materials are imaged in three dimensions with a resolution of several nanometers. Effective focal depth is determined by statistical analysis and the contributing factors are discussed. Finally, current challenges and future capabilities available through new instruments are discussed.

show abstract

mentioning

confidence: 99%

Depth sectioning with the aberration-corrected scanning transmission electron microscope

Borisevich

Lupini

Pennycook

2006

Proc. Natl. Acad. Sci. U.S.A.

236

157

View full text Add to dashboard Cite

show abstract

“…For example, Wang has simulated the ADF images in STEM including inelastic thermal diffuse scattering based on a generalized multislice theory (Krivanek et al ., ); Allen et al . have developed a Bloch wave framewok for lattice‐resolution contrast derived from coherent or incoherent scattering of an electron probe focused onto ZnS crystal (Pennycook et al ., ). More recently, sub‐Å secondary electron (SE) images have been experimentally achieved with a spherical Cs‐corrected field emission STEM; single atoms and atomic lattices on a crystalline surface are unambiguously presented in SE images for the first time (Zhu et al ., ).…”

Section: Introductionmentioning

confidence: 98%

Calculation of Bohmian quantum trajectories for STEM

Zhang

Zeng

et al. 2015

Journal of Microscopy

View full text Add to dashboard Cite

We present in this work the calculation of Bohmian quantum trajectories representing the wave function propagation in a crystal for a focused electron probe in a scanning transmission electron microscope (STEM). The wave function and quantum trajectories are obtained from the calculation of time-dependent Schrödinger equation by fast Fourier transformation multislice algorithm. In our work, the Bohmian quantum trajectories of a scanning probe penetrating a Cu crystal are studied as an example of this calculation scheme. The results help us to better understand the electron diffraction process in a microscopic imaging from a trajectory-based point of view. This Bohmian quantum trajectory method can be used to extend the application of classical Monte Carlo method from the study of electron interaction with amorphous solid to crystalline structure.

show abstract

“…Interactions have been established with numerous leading groups worldwide, with two visiting Japan Society for the Promotion of Science Fellows, a Wigner Fellow, and a Humboldt Fellow. Their work has resulted in highvisibility publications as cited above, and several more (Pennycook, Lupini et al 2003;Diebold, Foran et al 2004;McBride, Kippeny et al 2004;Shibata, Pennycook et al 2004) with numerous talks at international meetings. This could not have been achieved without the LDRD project.…”

Section: Benefitsmentioning

confidence: 99%

Laboratory Directed Research and Development Program FY 2004 Annual Report

Sjoreen¹

2005

View full text Add to dashboard Cite

Average project duration 24 months 16 months Terascale Computing and Simulation ScienceThe intent of terascale computing and simulation science initiative is to establish ORNL as a world leader in capability computing as a tool for scientific discovery. The initiative recognizes the importance of computing infrastructure and scientific computing in addressing key R&D issues of DOE's missions. As the development of supercomputers continues, advances in processing power must be complemented by advances in computing, communications, and information tools and technologies. At the same time, the dramatic advances in the power and performance of computers are opening new pathways to the modeling and simulation of physical systems and providing new insights into a host of complex science and engineering problems. In FY 2004, the research priorities for this initiative focused on three areas: 1. scientific applications to create new models for fusion energy, biology, nanoscience, physics, materials science, chemistry, and climate; 2. mathematics and computer science including distributed and cluster computing, mathematical analysis, scalable numerical algorithms, mesh generation and discretization technology, petascale data analysis, and data visualization; and 3. middleware development for easy-to-use, reliable, high-performance, and secure access to data and tools.

show abstract

Aberration-Corrected Scanning Transmission Electron Microscopy: The Potential for Nano- and Interface Science

Cited by 20 publications

References 41 publications

Depth sectioning with the aberration-corrected scanning transmission electron microscope

Depth sectioning with the aberration-corrected scanning transmission electron microscope

Calculation of Bohmian quantum trajectories for STEM

Laboratory Directed Research and Development Program FY 2004 Annual Report

Contact Info

Product

Resources

About