Depth sectioning with the aberration-corrected scanning transmission electron microscope

Borisevich, Albina Y.; Lupini, Andrew R.; Pennycook, Stephen J.

doi:10.1073/pnas.0507105103

Cited by 236 publications

(164 citation statements)

References 22 publications

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“…It has been pointed out that the focal depth of an aberration-corrected microscope in the STEM mode can be reduced by increasing the convergence angle of the probe (Borisevich et al 2006) or by using a confocal geometry (Frigo et al 2002;Nellist et al 2006). This makes it possible to retrieve detailed structural information from defects contained within the crystal volume (Lupini et al in press).…”

Section: (A) Detection Of Buried Defectsmentioning

confidence: 99%

Background, status and future of the Transmission Electron Aberration-corrected Microscope project

Dahmen

Erni

Radmilović

et al. 2009

Phil. Trans. R. Soc. A.

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The strong interaction of electrons with small volumes of matter make them an ideal probe for nanomaterials, but our ability to fully use this signal in electron microscopes remains limited by lens aberrations. To bring this unique advantage to bear on materials research requires a sample space for electron scattering experiments in a tunable electron-optical environment. This is the vision for the Transmission Electron Aberrationcorrected Microscope (TEAM) project, which was initiated as a collaborative effort to re-design the electron microscope around aberration-correcting optics. The resulting improvements in spatial, spectral and temporal resolution, the increased space around the sample and the possibility of exotic electron-optical settings will enable new types of experiments. This contribution will give an overview of the TEAM project and its current status, illustrate the performance of the TEAM 0.5 instrument, with highlights from early applications of the machine, and outline future scientific opportunities for aberration-corrected microscopy.Keywords: aberration correction; depth sectioning; monochromator; single-atom detection; light atom imaging; electron microscopy Overview of the Transmission Electron Aberration-corrected Microscope projectRecent advances in aberration-correcting electron optics have led to increased resolution, sensitivity and signal-to-noise (S/N) ratio in atomic resolution microscopy. These advances have created the opportunity to directly observe the atomic-scale order, electronic structure and dynamics of individual nanoscale objects by advanced transmission electron microscopy (TEM). To take advantage of this opportunity, the Transmission Electron Aberration-corrected Microscope (TEAM) project was initiated to optimize the electron microscope around aberration-corrected electron optics and to further advance the limits of the instrument and the technique. The project brings together several leading microscopy groups supported by the US Department of Energy's (DOE's) Office *Author for correspondence (udahmen@lbl.gov).One contribution of 14 to a Discussion Meeting Issue 'New possibilities with aberration-corrected electron microscopy'. http://www.science.doe.gov). After its completion, the instrument will be made available to the scientific user community at the National Center for Electron Microscopy (NCEM).The vision for the TEAM project is the idea of providing a sample space for electron scattering experiments in a tunable electron-optical environment by removing some of the constraints that have limited electron microscopy until now. The resulting improvements in spatial, spectral and temporal resolution, the increased space around the sample and the possibility of setting up novel electronoptical configurations will enable new types of experiments in electron scattering. The TEAM microscope will feature unique corrector elements for spherical and chromatic aberrations, a novel atomic-force-microscopy-inspired specimen stage, a high-brightness gun and numerous other in...

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Section: (A) Detection Of Buried Defectsmentioning

confidence: 99%

Background, status and future of the Transmission Electron Aberration-corrected Microscope project

Dahmen

Erni

Radmilović

et al. 2009

Phil. Trans. R. Soc. A.

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“…Optical sectioning has been demonstrated in previous work for single Hf atoms in SiO 2 (van Benthem et al 2005) and for small Pt and Au nanoparticles in a TiO 2 powder (Borisevich et al 2006). The positions of single atoms were located in three dimensions by van Benthem et al (2005) with an error of less than a nanometre, while Borisevich et al (2006) showed that the reconstructed shapes of large particles are elongated along the optic axis. In this paper, we present results from experimental STEM optical sectioning of samples containing Pt and Au nanoparticles of varying size.…”

Section: Introductionmentioning

confidence: 99%

Three-dimensional imaging by optical sectioning in the aberration-corrected scanning transmission electron microscope

Behan

Cosgriff

Kirkland

et al. 2009

Phil. Trans. R. Soc. A.

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The depth resolution for optical sectioning in the scanning transmission electron microscope is measured using the results of optical sectioning experiments of laterally extended objects. We show that the depth resolution depends on the numerical aperture of the objective lens as expected. We also find, however, that the depth resolution depends on the lateral extent of the object that is being imaged owing to a missing cone of information in the transfer function. We find that deconvolution methods generally have limited usefulness in this case, but that three-dimensional information can still be obtained with the aid of prior information for specific samples such as those consisting of supported nanoparticles. We go on to review how a confocal geometry may improve the depth resolution for extended objects. Finally, we present a review of recent work exploring the effect of dynamical diffraction in zone-axis-aligned crystals on the optical sectioning process.

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“…been demonstrated previously [21,22]. In a non-confocal geometry, however, this approach can only be used for high-resolution imaging as the 3D transfer function for incoherent STEM imaging shows a missing cone which results in significant elongation in 3D images of laterally extended objects [23].…”

Section: Using This Reduced Depth Of Focus To Retrieve 3d Informationmentioning

confidence: 99%

Applications of the Oxford-JEOL aberration-corrected electron microscope

Nellist

Kirkland

2010

Philosophical Magazine

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Depth sectioning with the aberration-corrected scanning transmission electron microscope

Cited by 236 publications

References 22 publications

Background, status and future of the Transmission Electron Aberration-corrected Microscope project

Background, status and future of the Transmission Electron Aberration-corrected Microscope project

Three-dimensional imaging by optical sectioning in the aberration-corrected scanning transmission electron microscope

Applications of the Oxford-JEOL aberration-corrected electron microscope

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