Aberration-corrected STEM: current performance and future directions

Nellist, Peter D.; Chisholm, M. F.; Lupini, Andrew R.; Borisevich, Albina Y.; Sides, W.H.; Pennycook, Stephen J.; Dellby, Niklas; Keyse, R.; Krivanek, O. L.; Murfitt, Matthew F.; Szilágyi, Zoltán

doi:10.1088/1742-6596/26/1/002

Cited by 47 publications

(44 citation statements)

References 3 publications

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“…Details of the growth are described in ref 5. Nanowires were observed in crosssection at ambient temperature with an aberration-corrected STEM operating at 300 kV (VG Microscopes HB603U), an electron probe size of less than 0.08 nm, 19 and a depth of field of 3-4 nm. 14 The nanowires were found to be covered by a significant amount of Au nanoclusters, as exhibited by the brighter Z-contrast (Figure 1).…”

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confidence: 99%

Point Defect Configurations of Supersaturated Au Atoms Inside Si Nanowires

Benthem²,

Molina³

et al. 2008

Nano Lett.

123

110

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Aberration-corrected scanning transmission electron microscopy (STEM) is used to reveal individual Au atom configurations inside Si nanowires grown by Au-catalyzed vapor-liquid-solid (VLS) molecular beam epitaxy (MBE).We identify a substitutional and three distinct interstitial configurations, one of which has not been previously identified. We confirm the stability of the observed point defect configurations by density functional theory (DFT) calculations. The observed number densities of the various configurations are in accord with their calculated formation energies. The concentration of Au atoms is larger than the solubility limit, but the effect may be caused by the STEM beam.

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confidence: 99%

Point Defect Configurations of Supersaturated Au Atoms Inside Si Nanowires

Benthem²,

Molina³

et al. 2008

Nano Lett.

123

110

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“…2.5 monolayer (ML) loading in Figure 1a. In this imaging mode, the intensity contributed by an atom is roughly proportional to Z 2 , where Z is the atomic number, [16] so that Cr-rich regions (Z Cr = 24) appear bright on the background of the alumina support (Z Al = 13). Cr is visibly segregated into extended "patches" on the c-alumina surface.…”

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confidence: 99%

Dual Nanoparticle/Substrate Control of Catalytic Dehydrogenation

et al. 2007

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Chromia/alumina catalysts are widely used for oxidative dehydrogenation of alkanes, but questions about the relationship between their properties and characteristics remain. Experimental techniques and first‐principles calculations are used to demonstrate that the reaction is enabled by CrOx clusters adsorbed on alumina surfaces, and that the key reaction sites are low‐coordination‐number O atoms (see figure).

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“…Highangle annular dark-field (HAADF) images give a contrast that directly relates to the atomic numbers of the atomic columns: Z-contrast (Pennycook & Jesson, 1991). Aberration correction in STEM has also pushed the resolution of Z-contrast imaging to sub-å ngströ m resolution (Nellist et al, 2004).…”

Section: Direct Interpretation Of Hrtem Imagesmentioning

confidence: 99%

Electron crystallography: imaging and single-crystal diffraction from powders

Zou

Hovmöller

2007

Acta Crystallogr A Found Crystallogr

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The study of crystals at atomic level by electrons -electron crystallography -is an important complement to X-ray crystallography. There are two main advantages of structure determinations by electron crystallography compared to X-ray diffraction: (i) crystals millions of times smaller than those needed for X-ray diffraction can be studied and (ii) the phases of the crystallographic structure factors, which are lost in X-ray diffraction, are present in transmissionelectron-microscopy (TEM) images. In this paper, some recent developments of electron crystallography and its applications, mainly on inorganic crystals, are shown. Crystal structures can be solved to atomic resolution in two dimensions as well as in three dimensions from both TEM images and electron diffraction. Different techniques developed for electron crystallography, including threedimensional reconstruction, the electron precession technique and ultrafast electron crystallography, are reviewed. Examples of electron-crystallography applications are given. There is in principle no limitation to the complexity of the structures that can be solved by electron crystallography.

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Aberration-corrected STEM: current performance and future directions

Cited by 47 publications

References 3 publications

Point Defect Configurations of Supersaturated Au Atoms Inside Si Nanowires

Point Defect Configurations of Supersaturated Au Atoms Inside Si Nanowires

Dual Nanoparticle/Substrate Control of Catalytic Dehydrogenation

Electron crystallography: imaging and single-crystal diffraction from powders

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