2003
DOI: 10.1051/jp4:20030591
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Ablation de ZnO par laser UV (193 nm) : nano-agrégats en phase gazeuse

Abstract: La condensation de nano-agrégats d'oxyde de zinc en phase gazeuse est mise en évidence lors de l'ablation de ZnO massif par laser ArF pulsé. Nous comparons l'évolution spatio-temporelle de la forme du panache d'ablation (plume) de ZnO sous vide et sous atmosphère de gaz de couverture (oxygène et/ou hélium) à partir des images CCD et des résultats issus d'analyses spectroscopiques. L'expansion du plasma et la croissance des nanoclusters sont influencées par l'effet du confinement de la plume dû aux collisions e… Show more

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Cited by 4 publications
(5 citation statements)
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“…At the observation point situated far from the focal plane, the fluence of the focused ArF laser beam was about 200 mJ/cm 2 . This fluence is fairly high to induce the evaporation of atomic species from the nano-aggregates and their fragmentation [15,16]. The corresponding luminescence spectra are shown in Fig.…”
Section: Resultsmentioning
confidence: 99%
“…At the observation point situated far from the focal plane, the fluence of the focused ArF laser beam was about 200 mJ/cm 2 . This fluence is fairly high to induce the evaporation of atomic species from the nano-aggregates and their fragmentation [15,16]. The corresponding luminescence spectra are shown in Fig.…”
Section: Resultsmentioning
confidence: 99%
“…ZnO clusters prepared by laser ablation have been deposited on substrates or collected in gas-suspended nanoaggregates, , where they typically coalesce to 10−20-nm size particles with a relatively broad size distribution. Still smaller nanoparticles (of the order of 1 nm) have been obtained by laser ablation in liquid media, e.g., deionized water and ethanol, as confirmed by microscopic techniques .…”
Section: Introductionmentioning
confidence: 99%
“…The cluster size distribution is narrow and can be described by a Gaussian function with a maximum at 10 nm and a half-width of 3 nm. 23 The films, prepared with the optimized substrate temperature and gas partial pressures, have an intense UV excitonic luminescence and a very weak, defect-related band. The film thickness varies along the surface of a substrate, and thus allows measurements of film parameters as a function of film thickness.…”
mentioning
confidence: 99%