We describe experiments and measurements on a trapped and laser-cooled single ion of 88 Sr þ which, when probed on its reference 5s 2 S 1=2 ! 4d 2 D 5=2 transition at 445 THz, provides an optical frequency standard of evaluated accuracy outperforming the current realization of the SI second. Studies are presented showing that micromotion-associated shifts of the standard can be reduced to the 10 À18 level and uncertainties in the blackbody-induced shifts for the current system are at the low 10 À17 level due to the relatively well-known polarizability of the strontium ion system and careful choice of the trap structure. The current evaluated systematic shifts for the ion transition are at a fractional uncertainty of 2 Â 10 À17 . An absolute frequency measurement performed over a two-month period relative to a maser referenced to the SI second via Global Positioning System time transfer has determined the center frequency for the transition at SD ¼ 444 779 044 095 485:5 AE 0:9 Hz (1 ). DOI: 10.1103/PhysRevLett.109.203002 PACS numbers: 06.30.Ft, 32.70.Jz, 37.10.Ty, 42.50.Lc From precision tests of relativity to the increased understanding of atomic physics and fundamental constants, atomic time standards have helped shed light on subtle physical phenomena that underlie fundamental concepts of physics [1][2][3]. In addition, these references underpin the SI system which forms the basis of physical measurement. New experimental systems employing dipole forbidden optical transitions in trapped and laser-cooled ions and neutral atoms have been shown to be excellent nextgeneration realizations of ultra-accurate frequency references [3][4][5][6][7][8][9][10][11][12][13][14]. Such systems now have evaluated accuracies that exceed the current realizations of the definition of the SI second as realized by a microwave transition in Cs atoms [15]. Among the trapped ion systems studied, the 88 Sr þ 5s 2 S 1=2 ! 4d 2 D 5=2 electric dipole forbidden transition at 445 THz (674 nm) has a very high quality factor (Q ¼ 0 =Á ¼ 10 15 ) and possesses a relatively simple electronic energy level scheme that is favorable for use with widely available solid state laser technology [16]. This ion system was the first to be directly measured against the Cs realization of the second [17] and has been established as one of the secondary representations of the SI second. This system has been primarily studied at the Frequency and Time Group, National Research Council of Canada (NRC) and the National Physical Laboratory (NPL) in the United Kingdom [7,11] with additional groups recently providing results [18]. We describe new results and methods by which the systematic shifts for the system have been reduced to the low 10 À17 level via operation of the trap system under conditions which reduce and in some cases null out significant uncertainties which dominate many optical reference systems. The work also provides a new measurement of the transition center frequency relative to the SI second.A single atomic ion of 88 Sr þ is held in an electr...