Accelerated testing of IGBT power modules to determine time to failure

James, Prabin; Forsyth, A.J.

doi:10.1049/cp.2010.0123

Cited by 12 publications

(6 citation statements)

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“…It is thus necessary to employ a number of different techniques to accelerate failure mechanisms. These techniques, known as accelerated aging tests, are divided into three main categories: thermal cycling [11], [28]- [30], power cycling [31], [32], and electrical overstress [33]. It is noteworthy that due to the nature of failures, different failures are induced under different aging experiments.…”

Section: Aging Experimentsmentioning

confidence: 99%

“…The second method is the analytical lifetime prediction based on Coffin-Manson models, Norris-Landzberg models, or Bayerer's models [10]. The lifetime expectancy (in numbers of cycles) of an IGBT is experimentally obtained from the given environmental and load conditions [11]. The cumulative fatigue (or damage) of an IGBT is calculated based on actual operational conditions and its RUL which is then expressed as the number of cycles to failures.…”

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confidence: 99%

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Computationally Efficient, Real-Time, and Embeddable Prognostic Techniques for Power Electronics

Alghassi

Perinpanayagam

Samie

et al. 2015

IEEE Trans. Power Electron.

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Power electronics are increasingly important in new generation vehicles as critical safety mechanical subsystems are being replaced with more electronic components. Hence, it is vital that the health of these power electronic components is monitored for safety and reliability on a platform. The aim of this paper is to develop a prognostic approach for predicting the remaining useful life of power electronic components. The developed algorithms must also be embeddable and computationally efficient to support on-board real-time decision making. Current state-of-the-art prognostic algorithms, notably those based on Markov models, are computationally intensive and not applicable to real-time embedded applications. In this paper, an isolated-gate bipolar transistor (IGBT) is used as a case study for prognostic development. The proposed approach is developed by analyzing failure mechanisms and statistics of IGBT degradation data obtained from an accelerated aging experiment. The approach explores various probability distributions for modeling discrete degradation profiles of the IGBT component. This allows the stochastic degradation model to be efficiently simulated, in this particular example ∼1000 times more efficiently than Markov approaches. Index Terms-Isolated-gate bipolar transistor (IGBT), Monte-Carlo simulation (MCS), power electronics, prognostics, remaining useful life (RUL).

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Section: Aging Experimentsmentioning

confidence: 99%

mentioning

confidence: 99%

Computationally Efficient, Real-Time, and Embeddable Prognostic Techniques for Power Electronics

Alghassi

Perinpanayagam

Samie

et al. 2015

IEEE Trans. Power Electron.

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“…High power IGBT modules have a relatively long life time under normal use conditions therefore ALT is used for lifetime model parameterization [27]. ALT can be understood as a test method which makes a device fail faster than it would fail under normal use level conditions [28].…”

Section: N 2 E a δT J T M F (4) Bayerer K β 1 β 2 β 3 mentioning

confidence: 99%

An overview of the reliability prediction related aspects of high power IGBTs in wind power applications

Busca

Teodorescu

Blaabjerg

et al. 2011

Microelectronics Reliability

261

132

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Reliability is becoming more and more important as the size and number of installed Wind Turbines (WTs) increases. Very high reliability is especially important for offshore WTs because the maintenance and repair of such WTs in case of failures can be very expensive. WT manufacturers need to consider the reliability aspect when they design new power converters. By designing the power converter considering the reliability aspect the manufacturer can guarantee that the end product will ensure high availability. This paper represents an overview of the various aspects of reliability prediction of high power Insulated Gate Bipolar Transistors (IGBTs) in the context of wind power applications. At first the latest developments and future predictions about wind energy are briefly discussed. Next the dominant failure mechanisms of high power IGBTs are described and the most commonly used lifetime prediction models are reviewed. Also the concept of Accelerated Life Testing (ALT) is briefly reviewed.

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“…Due to the thermal capacitances of the different materials the temperatures do not reach critical values. On the other hand the life time of semiconductors is reduced because of the temperature ripple [14]. The FIT curve (Failure in Time) describes this dependency between temperature difference and number of pulse repetitions.…”

Section: Average Output Current I Avg [A]mentioning

confidence: 99%

Novel 3 level bidirectional buck converter with wide operating range for Hardware-in-the-Loop test systems

Carstensen

Biela

2012

2012 15th International Power Electronics and Motion Control Conference (EPE/PEMC)

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For Hardware-in-the-Loop tests of components for the distribution grid, for example circuit breakers, converter systems are required, which can generate a high power output with fast transients of the output signal. In this paper, a novel 3 level buck converter is presented, which is using 3 different supply voltages to enable a wide voltage operation range. The modulation of the converter is presented and the design of a prototype system is performed and optimized for pulsed power operation. The prototype is compared to a hard-switched NPCdesign.Index Terms-arbitrary current source, Hardware-in-the-loop, 3 level converter, buck converter

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Accelerated testing of IGBT power modules to determine time to failure

Cited by 12 publications

References 0 publications

Computationally Efficient, Real-Time, and Embeddable Prognostic Techniques for Power Electronics

Computationally Efficient, Real-Time, and Embeddable Prognostic Techniques for Power Electronics

An overview of the reliability prediction related aspects of high power IGBTs in wind power applications

Novel 3 level bidirectional buck converter with wide operating range for Hardware-in-the-Loop test systems

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