Acceleration of potential-induced degradation by salt-mist preconditioning in crystalline silicon photovoltaic modules

Abstract

We examined the sequential effects of salt-mist stress followed by high-system-voltage stress on the power loss of crystalline silicon photovoltaic (PV) modules to determine whether a crucial failure as potential-induced degradation (PID) is accelerated by material-property changes caused by the long-term effects of a less harmful stress such as salt-mist spraying. Degradation profiles confirmed in this study show that PID is accelerated by certain types of salt-mist preconditioning. For the acceleration of PID, the contribution of sodium ions liberated from the front glass of the PV module seems to be excluded. Therefore, we consider that the sodium ions penetrating into the PV modules from the ambient environment may also cause degradation according to the proposed mechanisms of PID, as the sodium ions existing in the front glass cause PID. Furthermore, this type of degradation may indicate the wear-out phenomenon after a long-term exposure in the field (especially near the coast).

Acceleration of degradation by highly accelerated stress test and air-included highly accelerated stress test in crystalline silicon photovoltaic modules

“…3; the diode factors estimated by Zhang's method modified by us were drastically elevated in all curves. 22,23) Indeed, the estimated diode factors were elevated by 2.1-2.4-fold following the application of DH stress for 4,000 h (the average diode factors of duplicate samples were 1.08 and 2.43 at the initial and final states, respectively). Similarly, the diode factors estimated from the I-V profiles obtained after HAST and air-HAST for 800 h were extremely high (over 2), although the maximum values at the initial state of these PV modules were less than 1.25.…”

“…Similarly, the diode factors estimated from the I-V profiles obtained after HAST and air-HAST for 800 h were extremely high (over 2), although the maximum values at the initial state of these PV modules were less than 1.25. This significant increase in the diode factor induced by the hygrothermal stresses was thought to be a result of nonuniform contact resistance, as reported by van der Heide (I ph ), reverse bias saturation current (I 0 ), diode factor (n), R sh , R S , I SC , and V OC ] are extracted from these current-voltage data according to our previous report, 23) the line for each condition is drawn by connecting data points on currents at given voltages, which are calculated using these extracted photovoltaic parameters. et al, 24) because the uneven distribution of dark regions was confirmed in their EL images.…”

Potential‐Induced Degradation in High‐Efficiency n‐Type Crystalline‐Silicon Photovoltaic Modules: A Literature Review

“…Hacke et al [ 59 ] reported that degradation rates increase with temperature and with humidity. Suzuki et al [ 60 ] examined the sequential effects of a salt‐mist treatment followed by high system‐voltage stress on performance loss. Their results show that salt‐mist spraying accelerates the PID of c‐Si PV modules.…”

Overview of Possibilities of Solar Floating Photovoltaic Systems in the OffShore Industry

“…Sea water is also a disadvantage for FPV systems. It is related to corrosion and potential induced degradation [85]. Because of submerged installation in the sea water environment, algae, marine invertebrates, and other small aquatic species attach and accumulate on the outer surface of submerged offshore structures, causing an increase in their size and changes in other physical properties [86].…”