2017
DOI: 10.1016/j.ultramic.2017.05.001
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Accuracy and precision of thickness determination from position-averaged convergent beam electron diffraction patterns using a single-parameter metric

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Cited by 10 publications
(11 citation statements)
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“…The localized region of network activation and response of 19.1 mrad is attributed to the reduction of pattern features when the convergence semi-angle is large. As a result, the 19.1 mrad CNN trained for determining thickness cannot handle thicker sample measurement, which has also been reported for LSF methods [10]. In order to reduce the complexity of the network, the acceptable thickness range is reduced to 1-80 nm for SrTiO 3 , which improves the network reliability (87-92.3%) when compared to LSF.…”
Section: Convergence Semi-angle Dependencementioning
confidence: 98%
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“…The localized region of network activation and response of 19.1 mrad is attributed to the reduction of pattern features when the convergence semi-angle is large. As a result, the 19.1 mrad CNN trained for determining thickness cannot handle thicker sample measurement, which has also been reported for LSF methods [10]. In order to reduce the complexity of the network, the acceptable thickness range is reduced to 1-80 nm for SrTiO 3 , which improves the network reliability (87-92.3%) when compared to LSF.…”
Section: Convergence Semi-angle Dependencementioning
confidence: 98%
“…To reduce human error and enhance the repeatability of the measurements, a semi-automated approach is usually employed. To this end, least square fitting (LSF) has been the primary tool [3,4,[8][9][10]. The parameter of interest, e.g.…”
Section: Introductionmentioning
confidence: 99%
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“…By comparing the experimental pattern to simulated ones, the thickness of the specimen in the electron beam direction was measured to be 31.0 ± 0.7 nm using the PACBED shown in Fig. 1(b) [32]. A slight specimen tilt of 0.5 mrad is observed and measured using the distance between the whole pattern center of mass and the center of the transmitted disk.…”
mentioning
confidence: 97%
“…By incoherently averaging diffraction patterns formed by rastering an atomicscale probe across one or more unit cells, a wealth of information is encoded in the intensity distribution around the zero-order disk. By pattern-matching algorithms, PACBED has been used to investigate specimen properties such as thickness [32,33], tilting of octahedra [29], and polarization [34]. In this article, single-crystal LaMnO 3 is selected to investigate intensity distribution changes in PACBED patterns caused by JTD, and the resultant structural parameters are compared with results from multiple complementary methods [20].…”
mentioning
confidence: 99%