Accuracy of measurements of basic parameters of observation thermal cameras

Abstract

Measurements of performance parameters of observation thermal cameras are usually conducted to check the applied design concept and the operation of implemented image-enhancing algorithms or to verify the manufacturer's claim regarding the figures of merit. In both cases there are several important conditions to be met in order to obtain reliable measurement results. One must have a measurement stand providing measurement uncertainty figures several times lower than the magnitude of measured parameter. There can be no influence of environmental conditions and the personnel conducting the test must precisely know the applicable procedures and should possess considerable experience in the measurements of thermal imaging devices. The paper presents the measurement equipment used to test the infrared imaging devices as well as measurement data analysis regarding basic camera parameters. Accuracy assessment were conducted on the basis of measurement methods and procedures implemented in Accredited Testing

Testing surveillance thermal imagers under simulated real work conditions

“…However, this way of experimental verification cannot be practically implemented because there are no certified thermal imagers of known parameters when working at extreme temperatures. In detail, there are accredited laboratories that can measure main parameters of thermal imagers (MRTD, MTF, NETD) and issue proper certificates but only when the tests are done at typical laboratory ambient temperatures [47].…”

Thermal Imager Range: Predictions, Expectations, and Reality

“…Using the standardized MRTD measurement procedure and measurement data processing [43,81] one can predict the thermal imager range for a selected target and field atmospheric attenuation factor. A standard processing procedure is defined for the target and atmospheric conditions that seem most probable in field applications and provides accuracy depending on accuracy of measurements [82,83]. Also, a similar measurement procedure could be developed and applied for advanced imagers [84], and the measurement results could be processed according to the TTP concept.…”