1996
DOI: 10.1109/22.556448
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Accurate and efficient circuit simulation with lumped-element FDTD technique

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Cited by 99 publications
(38 citation statements)
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“…Recently, the progress in numerical device simulation and the development of electromagnetic analysis tools, together with the availability of powerful workstations, have led to modeling approaches aimed to the numerical solution of the electromagnetic and electron transport problems in a consistent way [13]- [17]. Although potentially accurate, these models are still in a preliminary phase and their application to practical problems such as device scaling, circuit simulation, etc., may be difficult, also taking into account their computational cost.…”
mentioning
confidence: 99%
“…Recently, the progress in numerical device simulation and the development of electromagnetic analysis tools, together with the availability of powerful workstations, have led to modeling approaches aimed to the numerical solution of the electromagnetic and electron transport problems in a consistent way [13]- [17]. Although potentially accurate, these models are still in a preliminary phase and their application to practical problems such as device scaling, circuit simulation, etc., may be difficult, also taking into account their computational cost.…”
mentioning
confidence: 99%
“…Equation (3) shows that, for an isotropic radiator, the total power radiated is simply the power density at a particular distance multiplied by the area of the sphere, radius , enclosing the radiator. We can now calculate the measured and simulated effective conversion losses.…”
Section: Large-signal Resultsmentioning
confidence: 99%
“…The model used for the diode has been obtained from an HP application note [20]. A detailed description of the LE-FDTD implementation of the large-signal diode model without parasitics is given in [3]. In this paper, the package parasitics are included and their values are tuned to match the measured performance of a diode mounted in series in a microstrip line.…”
Section: Diode Model Validationmentioning
confidence: 99%
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“…It is more accurate over the older Ebers-Moll BJT model as it considers the secondary effects of the BJT device physics. Good coverage of BJT modeling using Ebers-Moll model is provided in [2,3]. Current methods of incorporating nonlinear components in FDTD usually result in nonlinear update equations for the electric field [2][3][4].…”
Section: Introductionmentioning
confidence: 99%