2012
DOI: 10.1109/ted.2012.2219863
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Accurate Compact Modeling for Sub-20-nm nand Flash Cell Array Simulation Using the PSP Model

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Cited by 10 publications
(1 citation statement)
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“…Charge-trap flash (CTF) memories are considered to represent the promising alternative in order for eventually replacing the floating-gate (FG) flash memory technologies in the near future owing to its higher device scalability and are targeted by developments of the most recent three-dimensional (3D) array architectures indeed. [1][2][3][4][5][6][7][8][9] Various device structures and charge trapping layer materials have been adopted for advancing the CTF memories and different physical mechanisms have been closely studied in the respective cell operations. In this work, a highly compact and accurate circuit model of CTF memory cell is proposed, in consideration of the transient behaviors for describing the program operations.…”
Section: Introductionmentioning
confidence: 99%
“…Charge-trap flash (CTF) memories are considered to represent the promising alternative in order for eventually replacing the floating-gate (FG) flash memory technologies in the near future owing to its higher device scalability and are targeted by developments of the most recent three-dimensional (3D) array architectures indeed. [1][2][3][4][5][6][7][8][9] Various device structures and charge trapping layer materials have been adopted for advancing the CTF memories and different physical mechanisms have been closely studied in the respective cell operations. In this work, a highly compact and accurate circuit model of CTF memory cell is proposed, in consideration of the transient behaviors for describing the program operations.…”
Section: Introductionmentioning
confidence: 99%