2018
DOI: 10.1002/pip.3077
|View full text |Cite
|
Sign up to set email alerts
|

Accurate control and characterization of Cu depletion layer for highly efficient Cu(In,Ga)Se2 solar cells

Abstract: The unintentional formation of a Cu depletion layer (CDL) on the surface of Cu(In,Ga)Se2 was observed in 1993, and CDLs have been expected to improve the performance of Cu(In,Ga)Se2 solar cells. However, methods of controlling CDLs have hitherto been unavailable. For the first time, we succeeded in controlling a uniform CDL on a Cu(In,Ga)Se2 surface by introducing irradiation with Se into the typical three‐stage growth process of Cu(In,Ga)Se2. We discuss the characterization and effects on device performance o… Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
3
1
1

Citation Types

0
29
0

Year Published

2019
2019
2023
2023

Publication Types

Select...
6

Relationship

2
4

Authors

Journals

citations
Cited by 21 publications
(29 citation statements)
references
References 38 publications
0
29
0
Order By: Relevance
“…[ 11,12 ] The benefits of copper‐poor OVC are as follows: it could widen the CIGS band gap through decreasing the valence band maximum (VBM), which forms a hole barrier; the formation of a buried homo‐junction owing to the similar crystal structure between OVC and CIGS; it is helpful to quench the deep level defects in CIGS. [ 11–15 ] Thus, the OVC is believed to improve the device performance by minimizing the carrier recombination at the CIGS/CdS interface. [ 13–15 ] In vacuum deposition process, every element deposition rate can be adjusted in real time.…”
Section: Introductionmentioning
confidence: 99%
See 2 more Smart Citations
“…[ 11,12 ] The benefits of copper‐poor OVC are as follows: it could widen the CIGS band gap through decreasing the valence band maximum (VBM), which forms a hole barrier; the formation of a buried homo‐junction owing to the similar crystal structure between OVC and CIGS; it is helpful to quench the deep level defects in CIGS. [ 11–15 ] Thus, the OVC is believed to improve the device performance by minimizing the carrier recombination at the CIGS/CdS interface. [ 13–15 ] In vacuum deposition process, every element deposition rate can be adjusted in real time.…”
Section: Introductionmentioning
confidence: 99%
“…[ 11–15 ] Thus, the OVC is believed to improve the device performance by minimizing the carrier recombination at the CIGS/CdS interface. [ 13–15 ] In vacuum deposition process, every element deposition rate can be adjusted in real time. Hence, the OVC formation can be accurately controlled.…”
Section: Introductionmentioning
confidence: 99%
See 1 more Smart Citation
“…Consequently, the net doping of this semiconductor layer needs not to be homogeneously distributed across the thin film. Evidence for this inhomogeneous distribution of the net-doping density has already been provided by several authors 44,45,46,47 via analyses conducted via scanning spreading-resistance microscopy. Spatial changes in the net doping affect the transport properties and also introduce band bending via Poisson's equation, both having impact on the EBIC signal.…”
Section: Variation Of the Net-doping Densities Between Neighboring Grmentioning
confidence: 76%
“…The different EBIC levels in the two adjacent grains (normalized about 1 and 1.1) can be attributed to slightly different net-doping densities (see Refs. 44,45,46,47 , and also Sec. 5.4 below for further details on this matter).…”
Section: Ebic Signals Across Line and Planar Defectsmentioning
confidence: 81%