2022
DOI: 10.1088/1361-6528/ac8998
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Accurate determination of MFM tip’s magnetic parameters on nanoparticles by decoupling the influence of electrostatic force

Abstract: Magnetic force microscopy (MFM) has become one of the most important instruments for characterizing magnetic materials with nanoscale spatial resolution. When analyzing magnetic particles by MFM, calibration of the magnetic tips using reference magnetic nanoparticles is a prerequisite due to similar orientation and dimension of the yielded magnetic fields. However, in such a calibration process, errors caused by extra electrostatic interactions will significantly affect the output results. In this work, we eva… Show more

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“…forces [247]. The magnetic force between a tip, which in the dipole approximation, has a fixed magnetic moment mtip, and the sample is due to the gradient of the stray field Bstray generated by surface and volume magnetic charges [248]:…”
Section: Working Principles Of Mfmmentioning
confidence: 99%
See 1 more Smart Citation
“…forces [247]. The magnetic force between a tip, which in the dipole approximation, has a fixed magnetic moment mtip, and the sample is due to the gradient of the stray field Bstray generated by surface and volume magnetic charges [248]:…”
Section: Working Principles Of Mfmmentioning
confidence: 99%
“…The van der Waals force is short-ranged but is more potent than electrostatic and magnetic forces. Thus, it is essential to position the AFM probe at least 30–50 nm above the topography scan (see Section 4 for more details) to account for the long-range magnetic forces [ 247 ]. The magnetic force between a tip, which in the dipole approximation, has a fixed magnetic moment m tip , and the sample is due to the gradient of the stray field B stray generated by surface and volume magnetic charges [ 248 ]: where the cantilever displacement is normal to the sample.…”
Section: Working Principles Of Mfmmentioning
confidence: 99%