Microelectronics Reliability
 2021
DOI: 10.1016/j.microrel.2021.114382
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Accurate determination of the peak channel temperature by an electrical method combined with EL mapping technique in In0.17Al0.83N/GaN HEMTs

Leilei Chen
1
,
Xiaohong Yan
2
,
Weiran Li
3
et al.
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