2016 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD) 2016
DOI: 10.1109/sispad.2016.7605177
|View full text |Cite
|
Sign up to set email alerts
|

Accurate IGBT modeling under high-injection condition

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
1
1

Citation Types

0
2
0

Year Published

2019
2019
2024
2024

Publication Types

Select...
1
1

Relationship

0
2

Authors

Journals

citations
Cited by 2 publications
(2 citation statements)
references
References 3 publications
0
2
0
Order By: Relevance
“…Before electrons reach the maximum speed, (5) where l is the traverse distance length that the electron travels as E is applied. So, (6) where ( 7)…”
Section: And Thusmentioning
confidence: 99%
See 1 more Smart Citation
“…Before electrons reach the maximum speed, (5) where l is the traverse distance length that the electron travels as E is applied. So, (6) where ( 7)…”
Section: And Thusmentioning
confidence: 99%
“…In addition to non-punch-through (NPT) IGBT, punch through (PT) IGBT mainly performs uniquely by introducing a buffer layer with N+. With the merits of NPT and PT IGBT, field-stop IGBT also introduces a buffer layer without dosage [1][2][3][4][5][6][7][8][9][10]. Nevertheless, most provided models mainly looks to BJT activated by imposing carriers into Base of it.…”
Section: Introductionmentioning
confidence: 99%