2021
DOI: 10.1088/1748-0221/16/09/p09028
|View full text |Cite
|
Sign up to set email alerts
|

Accurate modelling of 3D-trench silicon sensor with enhanced timing performance and comparison with test beam measurements

Abstract: This paper presents the detailed simulation of a double-pixel structure for charged particle detection based on the 3D-trench silicon sensor developed for the TIMESPOT project and a comparison of the simulation results with measurements performed at the π-M1 beam at PSI laboratory. The simulation is based on the combined use of several software tools (TCAD, GEANT4, TCoDe and TFBoost) which allow to fully design and simulate the device physics response in very short computational time, O(1–100 … Show more

Help me understand this report
View preprint versions

Search citation statements

Order By: Relevance

Paper Sections

Select...
1
1
1
1

Citation Types

7
28
0

Year Published

2022
2022
2024
2024

Publication Types

Select...
5
1
1

Relationship

3
4

Authors

Journals

citations
Cited by 20 publications
(35 citation statements)
references
References 26 publications
7
28
0
Order By: Relevance
“…The advantage of this method is that the final electronics response describes also the electrical couplings (sensor capacitance, sensor-electronics connection impedance) that are nearly impossible to be measured. This procedure has been recently applied on the interpretation of the test beam data of the TimeSPOT 3D silicon sensors [10], performed in October 2019, leading to a very good agreement between simulation and measured data.…”
Section: Spice-like Simulation and Semi-empirical Transfer Functionsmentioning
confidence: 98%
See 3 more Smart Citations
“…The advantage of this method is that the final electronics response describes also the electrical couplings (sensor capacitance, sensor-electronics connection impedance) that are nearly impossible to be measured. This procedure has been recently applied on the interpretation of the test beam data of the TimeSPOT 3D silicon sensors [10], performed in October 2019, leading to a very good agreement between simulation and measured data.…”
Section: Spice-like Simulation and Semi-empirical Transfer Functionsmentioning
confidence: 98%
“…Known custom packages for electronics simulation, such as Allpix 2 [20], use analytical white noise models, thus without any temporal correlation between noise samples. A more realistic model can be obtained by studying the power spectral density of common front-end electronics noise, as done in [10]. The noise spectrum is generally not flat throughout the frequency domain, but it exhibits higher intensity at lower frequencies.…”
Section: Noisementioning
confidence: 99%
See 2 more Smart Citations
“…This property can be exploited in minimising unevenness in the electric field and increasing the uniformity in signal response to obtain very high time resolutions. In the last years, results have been obtained by the TimeSPOT collaboration [56,57], which show that by proper design of the sensor layout and electrode geometry, the time resolution can be pushed well below 20 ps at room temperature. The measured resolution is limited by the front-end electronics performance, while the sensor intrinsic resolution is estimated around 10 ps.…”
Section: D Silicon Sensorsmentioning
confidence: 99%