Activation Analysis for Oxygen and Other Elements by Helium-3-Induced Nuclear Reactions.

Markowitz, Samuel S.; Mahony, John D.

doi:10.1021/ac60183a009

Cited by 106 publications

(28 citation statements)

References 13 publications

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“…Al mains in the field of light element analysis, highly sensitive CPAA procedures have now been devised for most stable elements. Detection limits reported for 72 elements are assembled in Figure 4 (3)(4)(5)(6)(7)(8)(9)(10)(11)(12)(13)(14), The data must be taken as "limits for qualitative detection" (15). The actual performance of CPAA is dependent on the major, minor, and/or trace element makeup of each sample.…”

Section: Scopementioning

confidence: 99%

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Charged Particle Activation Analysis

Schweikert¹

1980

Anal. Chem.

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When an ion beam interacts with matter, many different types of interactions occur. They can be at the atomic or nuclear levels, and some of these interactions result in the emission of signals which are element-or isotope-specific. Figure 1 summarizes the products resulting from ion bombardment and some of the ion beam techniques used for materials characterization. The probability of the different interactions varies with the type and the energy of the bombarding ions. If we consider only ion beams of energies ^1 MeV/nucleon (e.g., energies of at least 1 MeV for protons or 4 MeV for 4 He ions), there are three types of interactions that can be exploited for chemical analysis:• Ion atom collisions creating inner shell vacancies, which result in the emission of characteristic K, L, or M X-rays. This is the basis for the particle-induced X-ray emission technique or "PIXE" (/);• Elastic scattering of the bombarding ions, which allows measurement of the masses of the target atoms present. This technique is usually referred to as Rutherford backscattering spectrometry, RBS (2);• Nuclear reactions, particularly those yielding radioisotopes. The characteristics and amounts of the radioactivities are used to identify and quantify the parent isotopes present in the bombarded material. The best known of these techniques is neutron activation analysis, which uses neutrons as the bombarding species. The neutrons can be replaced with protons 0H+), deuterons ( 2 H+), tritons ( 3 H+), helium-3 ions ( 3 He + ), or helium-4 ions or alphas ( 4 He + ). In this case the technique is termed charged particle activation analysis, CPAA. The present discussion is devoted to CPAA. ScopeThe reasons for using CPAA stem from its unusual features. These in turn determine the technique's performance, viz. accuracy, sample size probed, sensitivity, and range of elements that can be detected.A major feature of CPAA is that different radionuclides can be obtained from a given target isotope, depending on the nature and energy of the bombarding particle. For protons, deuterons, and He-3 ions the energies used range from 5 to 20 MeV and from 20 to 45 MeV for He-4 ions. With these beams numerous nuclear reactions are possible (Figure 2). The multiple reaction pathways enhance the prospects of having for each stable isotope a reaction combining high yield and specificity. Conversely, with a greater number of activation reactions, the chances of obtaining the same radionuclide from isotopes belonging to different elements increase. Interferences multiply with rising bombarding energies. In practice a compromise must be found; sensitivity increases with bombarding energy, and selectivity sets an upper limit on the bombarding energy.In CPAA the sample depth probed is limited since the interaction of an ion beam with matter is accompanied by a rapid loss of energy. The penetration depth or range depends on the incident energy and nature of the bomScattered Ions RBS Incident Ion Visible Photons IILE X-rays PIXE Electrons IIAES y-rays CE Neutron and/or Ch...

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Section: Scopementioning

confidence: 99%

“…(7) television camera. (8) roughing pump. (9) graphite collimator, (10) sample holder tion of oxygen.…”

Section: Du_ Analytical Applicationsmentioning

confidence: 99%

Charged Particle Activation Analysis

Schweikert¹

1980

Anal. Chem.

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“…Influence du traitement chimique sur la teneur en oxygène à la surface de l'acier inoxydable 18.10 4.2 DOSAGE DANS LA MASSE. -A une énergie de 3,5 MeV la réaction 160(t, n)i8F* présente une section efficace du même ordre de grandeur que celle de la réaction 160(3He, p)i$F à son maximum (8)(9) MeV) [19] or cette réaction est la plus couramment utilisée pour le dosage de l'oxygène dans les métaux. D'après la forme de la courbe d'excitation établie par Nozaki et Okano [20], une sensibilité bien meilleure pourrait être obtenue en utilisant des tritons à des énergies et des intensités comparables à celles utilisées pour les dosages aux hélions 3.…”

Section: Tableauunclassified

Section efficace de la réaction 16O(t, n) 18F application au dosage de l'oxygène

Evel

Belo

Linck³

et al. 1977

Rev. Phys. Appl. (Paris)

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2014 Des échantillons de tantale oxydés anodiquement ont été irradiés avec des tritons de 1,6 à 3,7 MeV. La section efficace a été déterminée par mesure de la radioactivité du 18F. La valeur trouvée à 2 MeV est de 220 mb. Nos résultats sont en désaccord avec les valeurs publiées par Jarmie jusqu'à 2,2 MeV et avec la forme de la courbe obtenue par Barrandon et Albert entre 2 et 3 MeV. La réaction 16O(t, n) 18F a été utilisée pour doser l'oxygène à la surface d'échantillons d'acier inoxydable. Une limite de détection de 0,004 03BCg.cm-2 a été obtenue à 2 MeV, après 10 min. d'irradiation avec un faisceau de 0,2 03BCA de tritons. Les possibilités d'application aux dosages dans la masse sont discutées. Abstract. 2014 Anodic oxide films on tantalum were irradiated with tritons from 1.6 to 3.7 MeV. The cross sections were determined from the measurements of 18F radioactivity. At 2 MeV the cross section was found to be 220 mb. The results are in disagreement with the values of Jarmie up to 2.2 MeV and with the shape of the curve of Barrandon and Albert between 2 and 3 MeV. The 16O(t, n) 18F reaction was applied to the determination of surface oxygen concentration on stainless steel. A detection limit of 0.004 03BCg. cm-2 was obtained for a 10 min. irradiation with 0.2 03BCA of tritons at 2 MeV. The possibilities of oxygen determination in the bulk are discussed.

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“…The x and s subscripts refer to parameters associated with the silicon and standard samples, respectively. The average radiation cross sections were calculated by numerical integration (17,18) using values taken from the literature (19)(20)(21). Their computed values for 13.5 MeV 3He ions are given in Table I along with the ranges and the attenuation coefficients.…”

Section: Ns [T] As Cz Rx-~x(1 --E-xt~)e -~" ~mentioning

confidence: 99%

Comparison of Infrared and Activation Analysis Results in Determining the Oxygen and Carbon Content in Silicon

Gross¹,

Gaetano²,

Tucker³

et al. 1972

J. Electrochem. Soc.

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The oxygen and carbon content of several silicon single crystals have been measured using 8He activation techniques and are compared with values determined from infrared absorption measurements. The oxygen and carbon content of these crystals as determined from the activation analysis ranged from <0.05 to 28 ppm and <0.05 to 7 ppm, respectively. The infrared absorption measurements gave results that agreed with the activation analysis to within ~40%.Infrared absorption spectrophotometry has been used to determine the oxygen and carbon content of monocrystalline silicon (1-3). This method is particularly attractive because it has a sensitivity in the ppba (parts per billion atomic) range and it is inexpensive, quick, and nondestructive. However, questions regard-* Electrochemical Society Active Member.) unless CC License in place (see abstract). ecsdl.org/site/terms_use address. Redistribution subject to ECS terms of use (see 169.230.243.252 Downloaded on 2015-03-11 to IP

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Activation Analysis for Oxygen and Other Elements by Helium-3-Induced Nuclear Reactions.

Cited by 106 publications

References 13 publications

Charged Particle Activation Analysis

Charged Particle Activation Analysis

Section efficace de la réaction 16O(t, n) 18F application au dosage de l'oxygène

Comparison of Infrared and Activation Analysis Results in Determining the Oxygen and Carbon Content in Silicon

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