Active illumination focus variation

Bermudez, Carlos; Martinez, Pol; Cadevall, Cristina; Artigas, Roger

doi:10.1117/12.2525981

Cited by 9 publications

(9 citation statements)

References 5 publications

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“…demonstrated a 9x reduction in acquisition time for coherence scanning interferometry of inline R2R topography measurement by replacing broadband white light with monochromatic light. [ 85 ] However, even with the reduced acquisition time each measurement frame still required two seconds to complete the mechanical vertical scan of the interferometry objective and therefore is not appropriate for uninterrupted inline measurement.…”

Section: Inline Roll‐to‐roll Metrology Techniquesmentioning

confidence: 99%

Real‐Time Metrology for Roll‐To‐Roll and Advanced Inline Manufacturing: A Review

Maize

Cakmak

et al. 2022

Adv Materials Technologies

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Roll‐to‐Roll (R2R) manufacturing is changing how state‐of‐the‐art technology is made. Roll‐to‐Roll is part of a family of advanced scalable inline manufacturing techniques that make traditional and state‐of‐the‐art products at high yield and reduced cost. R2R manufacturing has grown rapidly and is fundamental to several advanced technologies such as functional materials and films, sensors for medicine, biology, and environment monitoring, energy harvesting devices, and flexible electronics. Advantages of R2R manufacturing include ease of machine design, adaptability to a wide range of additive processing methods, and very high throughput. To keep up with advances in R2R manufacturing, novel methods have emerged to measure important product metrics (thickness, roughness, conductivity) and monitor quality (uniformity, defects) inline and in real‐time. This review provides an overview of the state‐of‐the‐art for real‐time inline metrology and quality control in modern R2R manufacturing. The survey considers both established inline metrology techniques such as line‐scan imaging and reflectometry, and techniques recently adapted or that show promise for real‐time inline R2R metrology such as ellipsometry, hyper‐spectral imaging, and Raman spectroscopy.

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Section: Inline Roll‐to‐roll Metrology Techniquesmentioning

confidence: 99%

Real‐Time Metrology for Roll‐To‐Roll and Advanced Inline Manufacturing: A Review

Maize

Cakmak

et al. 2022

Adv Materials Technologies

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“…• Focus variation microscopy (FVM): FVM is another wellestablished surface measurement technology that uses local contrast in narrow-depth-of-field 2D images to build up a 3D height map of a surface [61]. Current research in FVM technologies includes development of algorithms to improve measurement of, for example, smooth surfaces and vertical walls [62,63], as well as in measurement speed increases and measurement system size decreases to allow for in-process measurements [2]. A thorough review of recent advances in FVM technologies is available elsewhere [61].…”

Section: Optical Surface Measurement Technologiesmentioning

confidence: 99%

“…Research into CM is currently focussed on development of methods for calibration and adjustment of CM systems [65], as well as in integrating confocal technologies with other surface measurement technologies, such as FVM, by developing methods for performing simultaneous FVM and CM in a single scan [66]. Other technologies exist that are similar to CM, such as active illumination focus variation [62] and structured illumination microscopy [67], though these are less well established in industrial surface measurement. Non-scanning chromatic confocal technologies can also be used for surface measurement [68], though their applications are more abundant in the biomedical sector than in manufacturing due to the generally poorer precision exhibited by chromatic systems compared to imaging systems [68,69].…”

Section: Optical Surface Measurement Technologiesmentioning

confidence: 99%

Smart optical coordinate and surface metrology

Catalucci

Thompson

Eastwood

et al. 2022

Meas. Sci. Technol.

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Manufacturing has recently experienced increased adoption of optimised and fast solutions for checking product quality during fabrication, allowing for manufacturing times and costs to be significantly reduced. Due to the integration of machine learning algorithms, advanced sensors and faster processing systems, smart instruments can autonomously plan measurement pipelines, perform decisional tasks and trigger correctional actions as required. In this paper, we summarise the state of the art in smart optical metrology, covering the latest advances in integrated intelligent solutions in optical coordinate and surface metrology, respectively for the measurement of part geometry and surface texture. Within this field, we include the use of a priori knowledge and implementation of machine learning algorithms for measurement planning optimisation. We also cover the development of multi-sensor and multi-view instrument configurations to speed up the measurement process, as well as the design of novel feedback tools for measurement quality evaluation.

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“…optically-sectioned images [16]. However, the Hi-Lo technique is more robust because it can also be used for smooth surfaces (also found on AM, specially at fully melted regions), so only Hi-Lo results are presented in this paper.…”

Section: Optical Designmentioning

confidence: 99%

Optical system for the measurement of the surface topography of additively manufactured parts

Vilar¹,

Artigas²,

Bermudez³

et al. 2022

Meas. Sci. Technol.

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Additive manufacturing (AM) is now regularly used for customised fabrication of parts with complex shapes and geometries. However, the large range of relevant scales, high slopes, step-like transitions, undercuts, alternation between dark and overly bright regions and other complex features present on the surfaces, in particular of metal additive parts, represent a significant challenge for current optical measurement technologies. Measuring surfaces with such complex features requires high numerical aperture (NA) optics, and state-of-the-art systems commonly include optics that can only reliably acquire surface topographies over a small field of view (FOV), typically tens or hundreds of micrometers. Such measurements are often insufficient for practical applications. Here, we present an optical system that features a large NA ( > 0.3) and a wide FOV 2.9 × 2.9 mm, capable of measuring AM parts in a single measurement, without the need for lateral stitching to increase the FOV. The proposed system exhibits optical properties that provide facility for large-field, high-resolution measurement of industrially-produced additively manufactured parts.

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Active illumination focus variation

Cited by 9 publications

References 5 publications

Real‐Time Metrology for Roll‐To‐Roll and Advanced Inline Manufacturing: A Review

Real‐Time Metrology for Roll‐To‐Roll and Advanced Inline Manufacturing: A Review

Smart optical coordinate and surface metrology

Optical system for the measurement of the surface topography of additively manufactured parts

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