Active line repair for thin-film-transistor liquid crystal displays

Wright, S. L.; Warren, K. W.; Alt, P. M.; Horton, R.; Narayan, C.; Greier, P. F.; Kodate, Manabu

doi:10.1147/rd.423.0445

Cited by 8 publications

(9 citation statements)

References 5 publications

Supporting

Mentioning

Contrasting

Unclassified

Order By: Relevance

“…Its most important goal is to identify and report the nature and location of the defects. (Common TFT array defects include opened or shorted wires [1], [2] and defective pixels [3], [4].) Comprehensive array testing is crucial in yield management and quality control since it is the first opportunity to evaluate the electrical performance of a display and the last reliable opportunity to perform repair on defective pixels and gate/data lines.…”

Section: A Tft Array Testingmentioning

confidence: 99%

A Charge-Sensing-Capable Source Driver for TFT Array Testing in System-on-Panel Displays

Lin¹,

Huang²

2009

JCP

View full text Add to dashboard Cite

Inside a modern flat-panel display, the TFT array acts as the analog memory that stores the image information. To ensure high overall yield, it is crucial to thoroughly test the TFT array before it enters the assembly line. However, TFT array testing gets complicated in system-on-panel displays because the peripheral circuits integrated on the same substrate as the array limit the access to the array’s inputs and outputs. This paper presents a builtin source driver design to facilitate TFT array testing for system-on-panel displays. In addition to writing data to the TFT array pixels, the proposed source driver is capable of executing the charge-sensing test and serial read-out of the charge- sensing results—both help reduce the required test equipment performance and complexity. The proposed source driver has been designed in LTPS technology. Circuit simulation results are shown to validate its performance.

show abstract

Section: A Tft Array Testingmentioning

confidence: 99%

A Charge-Sensing-Capable Source Driver for TFT Array Testing in System-on-Panel Displays

Lin¹,

Huang²

2009

JCP

View full text Add to dashboard Cite

show abstract

“…2 Both demand clean room, photo-lithography, chemical and physical vapour deposition and advanced testing facilities (see Figure 4). Unlike semiconductors, the manufacture of large-area or high-resolution TFT-LCDs is inherently less cyclical but it is much more difficult to achieve high yield and acceptable cost (Wright et al, 1998). Since LCDs are basically one big semiconductor, a single fault on a wafer might only ruin one of several dozen memory chips cut from that wafer, but could render an entire LCD screen useless.…”

Section: Liquid Crystal Display Technologymentioning

confidence: 99%

The co–evolution of technologies and institutions: a comparison of Taiwanese hard disk drive and liquid crystal display industries

Hung

2002

R & D Management

View full text Add to dashboard Cite

In this paper, we examine the different evolutionary processes and outcomes of the hard disk drive and liquid crystal display industries in Taiwan. To this end, we make two general theoretical claims. First, that an appreciation of the globalization of technology is as important as national institutions in understanding industry development in catch-up economies such as Taiwan. Second, in addressing both industrial survival and failure, that national institutions can have either a positive or a negative impact on sectoral activities. Empirically, we show that, in Taiwan, rigid social institutions conflict with the hard disk drive technology. This conflict, in turn, produces obstacles to Taiwanese firms' search for new markets and skills in hard disk drives. On the other hand, Taiwan's institutional structures provide a source of technical efficiency and market opportunity for the emerging liquid crystal display trajectory. This, in turn, drives Taiwanese industry towards adopting new practices in the manufacture of liquid crystal displays.

show abstract

“…Active matrix systems are prone to fabrication and operation related faults in interconnects and TFTs [10]- [11]. Interconnect faults such as opens and shorts cause pixels to become inaccessible.…”

Section: Introductionmentioning

confidence: 99%

Test System for Thin Film Transistor Parameter Extraction in Active Matrix Backplanes

Daniel

Nair

Sambandan

2019

IEEE J. Electron Devices Soc.

View full text Add to dashboard Cite

Thin film transistor (TFT) active matrix backplanes are used in large area electronic systems, such as displays and image sensors. With backplanes being fabricated on wearable and flexible substrates, the possibilities of operational faults in backplanes have increased. These faults could either be hard faults, such as line opens or shorts or could be softer faults, such as time dependent variations in the TFT transfer characteristics. Real time diagnosis of these faults require built-in-self-test systems. While many such systems have been demonstrated to diagnose hard faults, an easily realizable system to identify soft faults, such as variations in transistor transconductance remain an open challenge. In this paper, we discuss a system that extracts the transconductance by charging and then discharging the pixel capacitor at various gate voltages for an active matrix liquid crystal display backplane. This permits a plot of the time averaged current versus the gate voltage from which the spatial variation of transconductance can be extracted. The details of the design are discussed and a proof of concept with a 3 × 4 amorphous silicon backplane is demonstrated.

show abstract

Active line repair for thin-film-transistor liquid crystal displays

Cited by 8 publications

References 5 publications

A Charge-Sensing-Capable Source Driver for TFT Array Testing in System-on-Panel Displays

A Charge-Sensing-Capable Source Driver for TFT Array Testing in System-on-Panel Displays

The co–evolution of technologies and institutions: a comparison of Taiwanese hard disk drive and liquid crystal display industries

Test System for Thin Film Transistor Parameter Extraction in Active Matrix Backplanes

Contact Info

Product

Resources

About