2016 IEEE International Conference on Advanced Intelligent Mechatronics (AIM) 2016
DOI: 10.1109/aim.2016.7576952
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Adaptive tilting angles for a dual-probe AFM system to increase image accuracy

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Cited by 2 publications
(9 citation statements)
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“…During the dual-probe scanning, the distance between two probes is expected to stay constant for the consideration of minimizing the merging error. 4(b); (3) from our previous work [19], we can deduce a related result γ= tan À1 x cn z cn À ∅ 0 À θ n 2 and since ∅ 0 , θ n , x cn , and z cn are all known values, γ is naturally computable through the above equation, plus, furthermore, we can also obtain the L value with the calculated γ based on our previous work [19]; (4) finally, we can compute the compensation parameters for the probe's position under different tilting angles (∅ 0 + θ i ) as follows: where ∅ 0 is an original tilting angle and the rotation change of the tilting angle is denoted as θ i , i = 1, 2, …, n. Here, a method of compensating the probe position is proposed, which provides an effective way to calculate the position variation of the probe after the probe is rotated.…”
Section: Probe Position Compensation At Different Tilting Anglesmentioning
confidence: 99%
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“…During the dual-probe scanning, the distance between two probes is expected to stay constant for the consideration of minimizing the merging error. 4(b); (3) from our previous work [19], we can deduce a related result γ= tan À1 x cn z cn À ∅ 0 À θ n 2 and since ∅ 0 , θ n , x cn , and z cn are all known values, γ is naturally computable through the above equation, plus, furthermore, we can also obtain the L value with the calculated γ based on our previous work [19]; (4) finally, we can compute the compensation parameters for the probe's position under different tilting angles (∅ 0 + θ i ) as follows: where ∅ 0 is an original tilting angle and the rotation change of the tilting angle is denoted as θ i , i = 1, 2, …, n. Here, a method of compensating the probe position is proposed, which provides an effective way to calculate the position variation of the probe after the probe is rotated.…”
Section: Probe Position Compensation At Different Tilting Anglesmentioning
confidence: 99%
“…The first part is the measuring unit I as shown in Fig. A detailed description for the design of the dual probes AFM system is shown in [19]. A similar structure is shown in Fig.…”
Section: Dual-probes System Designmentioning
confidence: 99%
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