2014
DOI: 10.1021/jp5055342
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Adsorption of Au and Pd on Ruthenium-Supported Bilayer Silica

Abstract: Adsorption of Au and Pd over bilayer SiO2/Ru has been investigated using scanning-probe microscopy, X-ray photoemission spectroscopy (XPS), and density functional theory (DFT). Low temperature (∼5 K) atomic force (AFM) and scanning tunneling microscopy (STM) measurements reveal the presence of small adsorption features after exposing the samples to small doses of either metal. In the case of Pd, we note a homogeneous distribution of adsorbates across the entire surface, which consists of both amorph… Show more

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Cited by 49 publications
(53 citation statements)
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“…For the most extreme case (0.05 ML), we see little change in the Pd 3d spectrum upon heating to 200 K, indicating that the Pd structures formed following exposure at 100 K remain stable throughout that temperature range. By contrast, we note downward BE shifts associated with the silica-bound particles above 300 K, which reflects mobilization of Pd in this temperature range to result in progressively larger supported clusters [13,26,27]. As this trend continues at higher temperatures, the Pd eventually ends up in a state virtually equivalent to that formed when exposing the sample to 1 ML at 100 K, such that the two components are no longer distinguishable and produce a single 3d 5/2 XPS feature centered at ~335.6 eV.…”
Section: ~16×10contrasting
confidence: 55%
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“…For the most extreme case (0.05 ML), we see little change in the Pd 3d spectrum upon heating to 200 K, indicating that the Pd structures formed following exposure at 100 K remain stable throughout that temperature range. By contrast, we note downward BE shifts associated with the silica-bound particles above 300 K, which reflects mobilization of Pd in this temperature range to result in progressively larger supported clusters [13,26,27]. As this trend continues at higher temperatures, the Pd eventually ends up in a state virtually equivalent to that formed when exposing the sample to 1 ML at 100 K, such that the two components are no longer distinguishable and produce a single 3d 5/2 XPS feature centered at ~335.6 eV.…”
Section: ~16×10contrasting
confidence: 55%
“…Following liquid exposure, samples were blown dry in a flow of helium before reintroduction to the UHV system following placement within and subsequent evacuation of the transfer-chamber. As an extension of previous work dedicated to the characterization of small concentrations of Pd deposited on SiO 2 /Ru at low temperature [13,25], we conducted a series of temperature-dependent XPS measurements consistent with that shown in Figure 1a for Figure 1c. Note that the curved background is attributed to a broad Ru feature present in the absence of Pd, and that this has been accounted for via comparison with uncovered SiO 2 /Ru samples.…”
Section: ~16×10mentioning
confidence: 99%
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