“…However, the mechanism of silicon growth on the well-characterised ideal Si (111) and Si(100) surfaces is discussed in numerous studies. Modern methods of the analysis of surface such as thermodesorption, 98 low-energy electron diffraction, 98,100,101 secondary-ion mass spectrometry, 102 scanning tunnelling microscopy, 103 ± 108 reflection high-energy electron diffraction 109 ± 111 are used in these investigations. It was found that two neighbouring dangling bonds participate in elementary reactions of heterogeneous decomposition of mono-and disilane.…”