Advanced Computing in Electron Microscopy

Kirkland, Earl J.

doi:10.1007/978-1-4419-6533-2

Cited by 685 publications

(758 citation statements)

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“…In order to improve signal-to-noise ratio in the experimentally obtained ADF images, a few or tens of unit cells from a larger sample area are averaged [30] and presented in Figure 3 show the same ratio of relative intensity. With the same analysis method, we find that a great portion (> 50%) of bi-layer CVD grown MoS 2 takes the stacking sequence of AA'.…”

Section: Figure 2: (Color Online) Low-mag Adf Image Of Single-layer mentioning

confidence: 99%

Identifying different stacking sequences in few-layer CVD-grownMoS2by low-energy atomic-resolution scanning transmission electron microscopy

et al. 2016

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ABSTRACT:Atomically thin MoS 2 grown by chemical vapor deposition (CVD) is a promising candidate for the next-generation electronics due to inherent CVD scalability and controllability. However, it is well-known that the stacking sequence in few-layer MoS 2 can significantly impact the electrical and optical properties. Herein we report different intrinsic stacking sequences in CVD grown few-layer MoS 2 obtained by atomic-resolution annular-dark-field imaging in an aberration-corrected scanning transmission electron microscope operated at 50 keV. Tri-layer MoS 2 displays a new stacking sequence distinct from the commonly observed 2H and 3R phases of MoS 2 . Density functional theory is used to examine the stability of different stacking sequences, and the findings are consistent with our experimental observations.

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Section: Figure 2: (Color Online) Low-mag Adf Image Of Single-layer mentioning

confidence: 99%

Identifying different stacking sequences in few-layer CVD-grownMoS2by low-energy atomic-resolution scanning transmission electron microscopy

et al. 2016

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“…Position averaged convergent beam electron diffraction (PACBED) [23] was used for precise tilt alignment. PACBED patterns were simulated using Kirkland's frozen phonon multislice code [24].…”

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confidence: 99%

Symmetry Lowering in Extreme-Electron-Density Perovskite Quantum Wells

et al. 2013

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“…Databases of parameterization for both electron (Kirkland, 2010) and X-ray (Brown et al, 2006) scattering factors (or atomic form factors) are implemented in SUePDF. In cases of neutral atoms the electron database will be used; otherwise the X-ray database will be loaded in order to calculate the electron scattering factors for ions via the Mott-Bethe formula [equation (4)].…”

Section: Loading Electron Scattering Factorsmentioning

confidence: 99%

SUePDF: a program to obtain quantitative pair distribution functions from electron diffraction data

Tran¹,

Svensson²,

Tai³

2017

J Appl Crystallogr

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SUePDF is a graphical user interface program written in MATLAB to achieve quantitative pair distribution functions (PDFs) from electron diffraction data. The program facilitates structural studies of amorphous materials and small nanoparticles using electron diffraction data from transmission electron microscopes. It is based on the physics of electron scattering as well as the total scattering methodology. A method of background modeling is introduced to treat the intensity tail of the direct beam, inelastic scattering and incoherent multiple scattering. Kinematical electron scattering intensity is scaled using the electron scattering factors. The PDFs obtained after Fourier transforms are normalized with respect to number density, nanoparticle form factor and the non-negativity of probability density. SUePDF is distributed as free software for academic users.

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Advanced Computing in Electron Microscopy

Cited by 685 publications

References 0 publications

Identifying different stacking sequences in few-layer CVD-grownMoS2by low-energy atomic-resolution scanning transmission electron microscopy

Identifying different stacking sequences in few-layer CVD-grownMoS2by low-energy atomic-resolution scanning transmission electron microscopy

Symmetry Lowering in Extreme-Electron-Density Perovskite Quantum Wells

SUePDF: a program to obtain quantitative pair distribution functions from electron diffraction data

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