2013
DOI: 10.1016/j.tsf.2012.10.032
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Advanced electrical simulation of thin film solar cells

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Cited by 447 publications
(196 citation statements)
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“…Optoelectronic Simulations : Optoelectronic simulations were performed using SCAPS software. [ 47 ] The complete set of simulation parameters is included in Section S11 of the Supporting Information.…”
Section: Communicationmentioning
confidence: 99%
“…Optoelectronic Simulations : Optoelectronic simulations were performed using SCAPS software. [ 47 ] The complete set of simulation parameters is included in Section S11 of the Supporting Information.…”
Section: Communicationmentioning
confidence: 99%
“…[61] Device simulation was performed in SCAPS 3.2.01. [62] TRPL measurements were performed in a custom setup which uses a 660 nm wavelength pulsed laser source and time correlated single photon counting with an InGaAs photomultiplier calibrated from 900 to 1440 nm with an instrument response function less than 250 ps. PL emission from the samples is either taken panchromatically with a long-pass filter for the laser line or monochromatically with a full width at half maximum (FWHM) resolution <2 nm.…”
Section: With a [S]/([s]+[se]mentioning
confidence: 99%
“…23 SCAPS has the ability of defining the properties of the back contact, which is not possible in AMSP-1D simulator. 24,25 Also the higher values of defect density cannot be diverged in AMPS, but SCAPS can extend the simulations to more than 10 20 cm À3 .…”
Section: Modeling Procedure Scaps Baselinementioning
confidence: 99%