Advanced semiconductor characterization with aberration corrected electron microscopes

Modeling of temperature profiles in an environmental transmission electron microscope using computational fluid dynamics

“…It has been routinely used in fields such as catalysis, semiconductors and photonics as illustrated in a number of review papers [1][2][3][4][5][6][7]. No other tool provides the versatility of spatial information at high resolution along with the simultaneous acquisition of spectroscopic information.…”

Transmission electron microscopy analysis of some transition metal compounds for energy storage and conversion

“…With the help of advanced TEM techniques, the origin of the properties of these anode materials encoded in their microstructures can be elucidated. Several review articles covering such subjects have been published [9,[15][16][17][18][19]. To illustrate a property-structure relationship, the importance of obtaining high resolution images and spectra is obvious.…”

Revealing microstructure and dislocation behavior in BAlN/AlGaN heterostructures

“…1,17) The reciprocal lattice vectors g = 0002 and g ¼ 11 20 were selected from the image power spectrum to calculate the phase images and generate the subsequent twodimensional strain tensors during the GPA processing. 18) The strain was referenced from the AlN template and was thus relative. Figure 3(b) shows a map of the strain along the c-axis (ε yy ).…”