2017
DOI: 10.1002/jnm.2296
|View full text |Cite
|
Sign up to set email alerts
|

Advancements in the identification of passive RC networks for compact modeling of thermal effects in electronic devices and systems

Abstract: We deal with the problem of identifying the parameters of an equivalent lumped RC multiport network from time domain tabulated data of a corresponding distributed real eigenvalues problem, as obtained from either measurements or accurate simulation tools. A novel step response matrix identification procedure is proposed, based on the combination of an outer nonlinear least squares iteration for the relocation of time constants, and an inner convex programming cycle for the identification of the corresponding r… Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
3
1
1

Citation Types

0
12
0

Year Published

2020
2020
2023
2023

Publication Types

Select...
8

Relationship

0
8

Authors

Journals

citations
Cited by 15 publications
(12 citation statements)
references
References 47 publications
(99 reference statements)
0
12
0
Order By: Relevance
“…Our prior work removed the time-dependent components-heat capacity-from a generalized one-dimensional model of an MVA [19]. While a time-dependent model can be a valuable tool for determining a thermal management structure's ability to resist thermal excursions and other unpredictable thermal phenomena, those models rely only on the steady-state behavior of MVAs to determine baseline performance criteria [23,24]. While this technique is used for MVAs with solid-core vias, the same technique can be extended to an equivalent PCB-based system.…”
Section: Through-plane Resistancementioning
confidence: 99%
See 1 more Smart Citation
“…Our prior work removed the time-dependent components-heat capacity-from a generalized one-dimensional model of an MVA [19]. While a time-dependent model can be a valuable tool for determining a thermal management structure's ability to resist thermal excursions and other unpredictable thermal phenomena, those models rely only on the steady-state behavior of MVAs to determine baseline performance criteria [23,24]. While this technique is used for MVAs with solid-core vias, the same technique can be extended to an equivalent PCB-based system.…”
Section: Through-plane Resistancementioning
confidence: 99%
“…As such, similar variance in the measured heat spreading metrics of the fabricated MVAs can be expected. These values were integrated into the FCS model from [10,24,25] and were simulated over 101 FCS iterations. The variance of the heat distribution was calculated for each temperature profile to act as a baseline for comparison against the measured results.…”
Section: Extraction and Uncertainty Analysismentioning
confidence: 99%
“…As mentioned, research works in the field of modular electrical devices are carried out, some of them quite advanced. The authors present dynamic voltage models [31,32] and CFD models [33][34][35][36][37][38][39].…”
Section: Introductionmentioning
confidence: 99%
“…In addition, using coupled analyses: Maxwell 3D, Fluent CFD, Transient Thermal, allowing for an accurate temperature distribution on the busbars and inside the switchgear [28][29][30][31]. This type of calculation allows the structure to be optimized in terms of high temperature resistance, as well as heat dissipation from the switchgear to the environment [32][33][34][35][36][37]. The novelty of the approach is clearly the cost reduction concerning expensive experimental research and also the ability to reduce materials quantities that ought to be used for switchgear assembly.…”
Section: Introductionmentioning
confidence: 99%