1995
DOI: 10.1016/0951-8320(95)00049-8
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Advances in digraph model processing applied to automated monitoring and diagnosis

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Cited by 6 publications
(5 citation statements)
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“…However, since system failures are not usually the outcome of a single fault, the ability to diagnose multiple faults is of vital importance. Hence following Rao's technique, Iverson [26] considered the combination of two failures via an AND gate, however its limitation lies in the number of potential fault causes. The latter was overcome with the work of Pattipati [27], whose approach was based on Rao's work and was able to diagnose multiple failures in a system.…”
Section: Fault-tree Analysis For Diagnosis -A Brief Reviewmentioning
confidence: 99%
“…However, since system failures are not usually the outcome of a single fault, the ability to diagnose multiple faults is of vital importance. Hence following Rao's technique, Iverson [26] considered the combination of two failures via an AND gate, however its limitation lies in the number of potential fault causes. The latter was overcome with the work of Pattipati [27], whose approach was based on Rao's work and was able to diagnose multiple failures in a system.…”
Section: Fault-tree Analysis For Diagnosis -A Brief Reviewmentioning
confidence: 99%
“…The issues involved with diagnosing single faults in systems are addressed by Rao [9]. Iverson and Pattersine-Hine [10] extend this approach by considering the combination of two failures via an AND gate, and identify the potential for real-time automated monitoring and diagnosis.…”
Section: Introductionmentioning
confidence: 99%
“…Iverson and Pattersine-Hine [10] extend this approach to also consider the combination of two failures via an AND gate. This method has a use in real-time automated monitoring and diagnosis, although its limitation lies in the number of potential fault causes.…”
Section: Introductionmentioning
confidence: 99%