1975
DOI: 10.1016/0020-0891(75)90046-9
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Advances in Hg implanted Hg1−xCdxTe photovoltaic detectors

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1977
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Cited by 26 publications
(2 citation statements)
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“…2 for the two different growth runs. The composition values were determined both by measuring the 77~ cutoff wavelengths of a set of photovoltaic detectors prepared by ion implantation (14) on the surface of wafers cut at right angles to the growth direction and by measuring the absorption edges of the same samples at room temperature. The latter analysis method, rather integral, was used once the solidification interface, under the experimental conditions, was proved to be flat (15) and radially symmetric (16) as to allow ~x < 0.01 composition variations over 80% of the solidification interface diameter.…”
Section: Proposed Methods and Some Experimental Resultsmentioning
confidence: 99%
“…2 for the two different growth runs. The composition values were determined both by measuring the 77~ cutoff wavelengths of a set of photovoltaic detectors prepared by ion implantation (14) on the surface of wafers cut at right angles to the growth direction and by measuring the absorption edges of the same samples at room temperature. The latter analysis method, rather integral, was used once the solidification interface, under the experimental conditions, was proved to be flat (15) and radially symmetric (16) as to allow ~x < 0.01 composition variations over 80% of the solidification interface diameter.…”
Section: Proposed Methods and Some Experimental Resultsmentioning
confidence: 99%
“…For a photoconductive device fluctuations occur in both the rate of generation and recombination of carriers, whereas for a photodiode this latter mechanism is absent, hence producing an increase in D* of v 2. Thus 18 / n \ ' D*(photoconductor) = 2.52 x 10 A [ ~-) 2 (11) D* (photovoltaic) = 3.56xl0 18 A I -\ 5…”
mentioning
confidence: 99%