Advances in Microwave Large-Signal Metrology: From Vector-Receiver Load-Pull to Vector Signal Network Analyzer and Time-Domain Load-Pull Implementations (Invited Paper)

Abstract

Radiofrequency (RF) power amplifiers (PAs) are important elements of modern communication systems. The most important components in PAs are the transistors, which are operated under large-signal regimes in such applications. Designing and optimizing PAs are challenging tasks that demand the highest accuracy on large-signal measurements at both device and circuit levels. Large-signal power transistor characterization demands the development and utilization of high-frequency and low-frequency load-pull systems. Furthermore, the static and dynamic characterization of two-input PAs requires the development of new measurement systems that consist of an nonlinear vector network analyzer (NVNA) and an arbitrary waveform generators (AWG). This paper reviews the research activities, achievements, and current research goals at CICESE Research Center in Mexico in the large-signal microwave metrology field.

An Overview of RF and Microwave Research in Latin America: Scanning Latin American Research on Microwaves

“…CICESE is the Mexican institution with the longest tradition in RF and microwaves. It carries out research along two main lines: power amplifier characterization and microwave metrology [73]- [76], and planar sensors for materials monitoring and characterization [77]- [80].Figure 5 illustrates some of the measurement equipment available at the Laboratory of RF and Microwave located in the Applied Physics Division at CICESE. Figure 6 shows an experimental setting for materials characterization.…”