1996
DOI: 10.1021/la950460j
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AFM and SALS Characterization of Spherulitic Structure in Polyethylene

Abstract: The atomic force microscope (AFM) has been used to characterize both microscopic and macroscopic structure in solution-cast films of high-density polyethylene (HDPE) on mica. Upon sample quench both large-scale spherulitic morphologies and smaller scale individual polyethylene lamella were easily distinguished and amorphous and crystalline regions inferred. Small angle light scattering (SALS) was used to confirm spherulitic structure and verify quantitative AFM size measurements. Upon anneal, spherulitic struc… Show more

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Cited by 6 publications
(3 citation statements)
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“…The diameter of the nodules observed in this study varied from about 15 to 55 nm. Our findings on untreated PP agree well with those of Viswanathan and Marr, who have worked with polyethylene and reported a granular structure originating from the spherulites of the polymer. The present observation of the increase in the size of the nodules with the treatment time (Figure ) indicates that etching is not the only explanation for the morphological changes.…”
Section: Discussionsupporting
confidence: 92%
“…The diameter of the nodules observed in this study varied from about 15 to 55 nm. Our findings on untreated PP agree well with those of Viswanathan and Marr, who have worked with polyethylene and reported a granular structure originating from the spherulites of the polymer. The present observation of the increase in the size of the nodules with the treatment time (Figure ) indicates that etching is not the only explanation for the morphological changes.…”
Section: Discussionsupporting
confidence: 92%
“…From the magnified images (Figure c,d), it became evident that these regions consisted of lamellae of different orientations, labeled by letters E and F. Region E was composed of lamellae in the edge-on orientation, whereas region F consisted of twisted and orderly stacked lamellae, most of them lying flat-on. This morphology reminds us of lamellar twisting, a common phenomenon for PE and other polymers. Lamellar twisting has been established in banded spherulites, where the band spacing depends on crystallization temperature. In the present case, the band period was not constant but varied in different regions.…”
Section: Resultsmentioning
confidence: 67%
“…The atomic force microscope (AFM) is particularly wellsuited to the study of nonconducting samples. 32 There have appeared in the literature many examples of AFM images obtained on oriented polymer films, [33][34][35] single crystals, 36,37 meltcrystallized polymers, 38,39 fibers, 40,41 and liquid crystalline polymers. 42 The ease of sample preparation combined with the ability of AFM to yield structural information on a nanometre scale have made this technique increasingly popular.…”
Section: Introductionmentioning
confidence: 99%