Aging-aware high-level physical planning for reconfigurable systems

Ghaderi, Zana; Bozorgzadeh, Eli

doi:10.1109/aspdac.2016.7428082

Cited by 19 publications

(2 citation statements)

References 13 publications

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“…Similarly, ref. [108] presented a reliability-aware floorplanning methodology along with delay-based aging estimation and run-time reconfiguration. A joint mitigation methodology using DPR, aimed at both soft errors and permanent faults in FPGAs was proposed by [109].…”

Section: Reliability Management In Reconfigurable Architecturesmentioning

confidence: 99%

Reliability-Aware Resource Management in Multi-/Many-Core Systems: A Perspective Paper

Sahoo

Ranjbar

Kumar

2021

JLPEA

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With the advancement of technology scaling, multi/many-core platforms are getting more attention in embedded systems due to the ever-increasing performance requirements and power efficiency. This feature size scaling, along with architectural innovations, has dramatically exacerbated the rate of manufacturing defects and physical fault-rates. As a result, in addition to providing high parallelism, such hardware platforms have introduced increasing unreliability into the system. Such systems need to be well designed to ensure long-term and application-specific reliability, especially in mixed-criticality systems, where incorrect execution of applications may cause catastrophic consequences. However, the optimal allocation of applications/tasks on multi/many-core platforms is an increasingly complex problem. Therefore, reliability-aware resource management is crucial while ensuring the application-specific Quality-of-Service (QoS) requirements and optimizing other system-level performance goals. This article presents a survey of recent works that focus on reliability-aware resource management in multi-/many-core systems. We first present an overview of reliability in electronic systems, associated fault models and the various system models used in related research. Then, we present recent published articles primarily focusing on aspects such as application-specific reliability optimization, mixed-criticality awareness, and hardware resource heterogeneity. To underscore the techniques’ differences, we classify them based on the design space exploration. In the end, we briefly discuss the upcoming trends and open challenges within the domain of reliability-aware resource management for future research.

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Section: Reliability Management In Reconfigurable Architecturesmentioning

confidence: 99%

Reliability-Aware Resource Management in Multi-/Many-Core Systems: A Perspective Paper

Sahoo

Ranjbar

Kumar

2021

JLPEA

View full text Add to dashboard Cite

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“…This performance degradation, referred to as transistor aging, is the result of several physical mechanisms (negative bias temperature instability (NBTI), electromigration (EM), and more), and is generally a greater concern when scaling to smaller technology nodes [23]. Fieldprogrammable gate arrays (FPGAs) are not immune to this efect, and several studies have measured how FPGA performance is afected by transistor aging [1,6,11].…”

Section: Introductionmentioning

confidence: 99%

Inducing Non-uniform FPGA Aging Using Configuration-based Short Circuits

Cook

Arscott

George

et al. 2022

ACM Trans. Reconfigurable Technol. Syst.

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This work demonstrates a novel method of accelerating FPGA aging by configuring FPGAs to implement thousands of short circuits, resulting in high on-chip currents and temperatures. Patterns of ring oscillators are placed across the chip and are used to characterize the operating frequency of the FPGA fabric. Over the course of several months of running the short circuits, with daily characterization of the FPGA performance, we demonstrate a decrease in FPGA frequency of 8.5%. We demonstrate that this aging is induced in a non-uniform manner. In, two-thirds of the configurable fabric contains short circuits. The maximum slowdown outside of the shorted regions is 2.1%, or about a fourth of the maximum slowdown that is experienced inside the shorted region. In addition, we demonstrate that the slowdown is linear after the first two weeks of the experiment and is unaffected by a recovery period. Additional experiments involving short circuits are also performed to demonstrate the results of our initial experiments are repeatable. These experiments also use a more fine-grained characterization method that provide further insight into the non-uniformed nature of the aging caused by short circuits.

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