2016
DOI: 10.1016/j.orgel.2015.10.025
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Al2O3/TiO2 nanolaminate gate dielectric films with enhanced electrical performances for organic field-effect transistors

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Cited by 41 publications
(27 citation statements)
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“…Figure 7d shows the dark J-V curve in semilogarithmic scale under positive and negative biases at room temperature. As can be seen, the leakage current density at −2 V is in the order of 10 −5~1 0 −4 A/cm 2 , which is in the same order of magnitude reported by Wei et al [5] and Baek et al [1] that used PEALD and tetrakis dimethylamino titanium (TDMAT) as precursor to growth TiO2 (20 nm) on Si.…”
Section: Current Density-voltage Measurementssupporting
confidence: 82%
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“…Figure 7d shows the dark J-V curve in semilogarithmic scale under positive and negative biases at room temperature. As can be seen, the leakage current density at −2 V is in the order of 10 −5~1 0 −4 A/cm 2 , which is in the same order of magnitude reported by Wei et al [5] and Baek et al [1] that used PEALD and tetrakis dimethylamino titanium (TDMAT) as precursor to growth TiO2 (20 nm) on Si.…”
Section: Current Density-voltage Measurementssupporting
confidence: 82%
“…Titanium dioxide (TiO 2 ) thin films and nanolaminates have a significant number of promising applications in different areas, such as microelectronics [1][2][3][4][5][6], photovoltaics [7,8], photocatalysis [9][10][11] fuel cells [12], sensors [13][14][15][16], anti-reflective coating applications [17], biomedical coatings [18,19] and food packaging applications [20]. The properties and applicability of TiO 2 thin films are intrinsically related to their crystal structure.…”
Section: Introductionmentioning
confidence: 99%
“…In an OFETs device, the charge density (Q = CV) localized at the first few semiconductor monolayers close to the interface is proportional to the dielectric constant [11,17]. Figure 2 illustrates a parallel-plate metal-insulator-metal (MIM) capacitor that is used to measure the dielectric properties of materials.…”
Section: Resultsmentioning
confidence: 99%
“…In the OTFT devices, the charge density (Q = CV) localized at the first few semiconductor monolayers close to the interface is proportional to the dielectric constant [14,15]. The electrical properties of dielectric were determined by measuring a parallel-plate metal-insulator-metal (MIM) capacitor, as plotted in Figure 3.…”
Section: Resultsmentioning
confidence: 99%