“…Ta and W films play the role of diffusion barriers against Cu at 600 • C in H 2 for 1 h [11], which is attributed to their high melting temperatures and immiscibility with Cu [7,12]. Amorphous binary and ternary nitrides (TaN x [7,13], WN x [14,15], Ta-W-N [16], and W-Ti-N [17]) have been used to raise the barrier temperatures to 600-800 • C. High-entropy alloy nitride films, such as (AlMoNbSiTaTiVZr) 50 N 50 [10], (AlCrTaTiZr)N [18], and (AlCrTaTiZrMo)N [19], with amorphous structures and large lattice distortions, have been applied as diffusion barriers [20]. The phase transformation of the aforementioned nitride films at elevated temperatures affected the performance of diffusion barriers.…”