A fourth-generation
copper metalorganic compound, Cu(I)-2-(tert-butylimino)-5,5-dimethyl-pyrrolidinate,
was designed,
and its chemistry on nickel surfaces was characterized, for use
as a precursor for atomic layer deposition (ALD) of thin solid metal
films. On the basis of surface science studies with similar acetamidinate,
guanidinate, and iminopyrrolidinate complexes, it was concluded that
the high (and undesirable) reactivity of these when adsorbed on metal
surfaces is due to the lability of their C–N bonds, which can
be triggered by β-hydrogen elimination steps. Accordingly, a
ligand was designed without any available hydrogen atoms at these
positions. The result is a much more stable reactant. Temperature-programmed
desorption (TPD) experiments indicated that dehydrogenation from the
new compound on Ni(110) starts only at 450 K, an increase of about
200 K in comparison with any of the earlier-generations ALD precursors.
TPD and X-ray photoelectron spectroscopy (XPS) data were used
to establish the details of the decomposition mechanism of the ligands,
which appears to be initiated by the scission of the iminopyrrolidine
C–N bond. Many byproducts are produced, including HCN, N2, iso-butene, and possibly pyrroline and
other olefins such as pentenes. However, all of that occurs at relatively
high temperatures, leaving an acceptable temperature window for the
use of this complex for the deposition of copper films. An increased
stability of the new ligands in our new copper ALD precursor was also
observed on SiO2 thin films, attesting to the generality
of our conclusions. We suggest that our methodology for the rational
design of this ALD precursor, based on studies of its surface chemistry,
can be easily extended to other cases.