2007
DOI: 10.1149/1.2721470
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ALD Technology - Present and Future Challenges

Abstract: Atomic layer deposition (ALD) is one of the established techniques among the other chemical and physical deposition techniques of today. There is still, however, a number of challenges for ALD to meet regarding both manufacturing and growth chemistry. The main manufacturing obstacle is the throughput which inherently is low for ALD. In the chemistry side the precursor development plays a very important role together with the understanding of which ALD technique, thermal or plasma enhanced (PE), or even… Show more

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Cited by 22 publications
(11 citation statements)
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“…The substrate size was limited by the research‐scale equipment used in this work. Commercial ALD equipment exists for coating 12″ wafers or even larger substrates as well as batches of over 100 wafers, which allow further upscaling of the present process. The as‐deposited SnS 2 films were amorphous, and crystallized upon annealing forming smooth, continuous films with the expected layered SnS 2 structure (Figure c,d) …”
Section: Resultsmentioning
confidence: 99%
“…The substrate size was limited by the research‐scale equipment used in this work. Commercial ALD equipment exists for coating 12″ wafers or even larger substrates as well as batches of over 100 wafers, which allow further upscaling of the present process. The as‐deposited SnS 2 films were amorphous, and crystallized upon annealing forming smooth, continuous films with the expected layered SnS 2 structure (Figure c,d) …”
Section: Resultsmentioning
confidence: 99%
“…In some cases, there may be channels into the surface, but the aspect ratio of these channels-the ratio of the channel depth to width-is rarely greater than 100 [39,40]. The desired films are also reasonably thick, usually greater than 2 nm and often up to 20 nm [39,40]. For an ALD film growth rate of 0.04 nm/cycle, even a 2-nm film would require 50 cycles, whereas a 20-nm film would require 500 cycles.…”
Section: Design Considerations For Semiconductor Applicationsmentioning
confidence: 99%
“…The flow rates of the carrier gas are typically in the order of 100 mL/min to 200 mL/min, corresponding to linear gas velocities of 2.5 m/s to 10 m/s across the substrate [41,42]. The precursor and ligand-removal reagents can be inserted into the carrier stream as short pulses typically of 0.5-s duration [39], and passed over the sample by convection. Due to the high flow velocities, back mixing is negligible.…”
Section: Design Considerations For Semiconductor Applicationsmentioning
confidence: 99%
“…Jackson et al have attempted to combine the methods discussed above for the deposition of AlF3 by using TMA and TaF5 as precursors [145]. This approach is somewhat questionable, as it has been reported that combining TMA with metal halides generally leads to metal carbide deposition [178][179][180]. In addition, a similar ligand exchange reaction between TMA and TaF5, as was depicted in Equation (2), should produce pentamethyl tantalum which has been reported to be unstable [181,182].…”
Section: Ald Of Metal Fluorides Using Metal Fluorides As the Fluorinementioning
confidence: 99%