2014
DOI: 10.1016/j.jcrysgro.2014.02.039
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AlGaN-based deep ultraviolet light-emitting diodes grown on nano-patterned sapphire substrates with significant improvement in internal quantum efficiency

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Cited by 70 publications
(37 citation statements)
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“…The frequency of the E 2 high phonon mode was located at 658.6 cm −1 for AlN with 0-period SLs and at 658 cm −1 for AlN with 3∼30 period SL structures. For stress-free AlN 17 , 18 , the frequency was located at 657.4 cm −1 . Notably, the AlN epilayers with 0∼30 period SL structures exhibited a higher frequency compared to the stress-free frequency, which is indicative of compressive stress.…”
Section: Resultsmentioning
confidence: 99%
See 1 more Smart Citation
“…The frequency of the E 2 high phonon mode was located at 658.6 cm −1 for AlN with 0-period SLs and at 658 cm −1 for AlN with 3∼30 period SL structures. For stress-free AlN 17 , 18 , the frequency was located at 657.4 cm −1 . Notably, the AlN epilayers with 0∼30 period SL structures exhibited a higher frequency compared to the stress-free frequency, which is indicative of compressive stress.…”
Section: Resultsmentioning
confidence: 99%
“…Notably, the AlN epilayers with 0∼30 period SL structures exhibited a higher frequency compared to the stress-free frequency, which is indicative of compressive stress. Moreover, the in-plane compressive stress (σ) of AlN can be evaluated by the following equation 17 , 18 : …”
Section: Resultsmentioning
confidence: 99%
“…Closely packed PS monolayer was transferred to the sapphire substrate with an LT‐AlN buffer. Details on the AlGaN thin film preparation were described elsewhere . The diameter of PS sphere was then reduced by O 2 trimming, without changing the location of the spheres.…”
Section: Methodsmentioning
confidence: 99%
“…When the perturbation introduced by the excitation source is very small (low injection regime), the IQE values describe the material properties in terms of radiative and non-radiative processes. However, it is difficult to compare these data with the literature since most reported values are measured under pulsed excitation [49][50][51][52][53][54][55][56][57][58], using power densities in the range of 5-1000 kW/cm 2 [49][50][51][52]54,55], to emulate the carrier injection at LED operating conditions. In this pumping regime, the photogenerated carrier densities are higher than the doping level of the original structure (high injection) and nonradiative recombination paths are partially saturated.…”
Section: Nanowires Vs Planar Layersmentioning
confidence: 99%