2016
DOI: 10.1109/tcad.2015.2511148
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All-Region Statistical Model for Delay Variation Based on Log-Skew-Normal Distribution

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Cited by 17 publications
(4 citation statements)
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“…A substantial number of contributions in this domain has been summarized by Azzalini and Capitanio [7] (pp. [218][219][220], and (also for space reasons) we do not reproduce them here. More recent contributions, focusing especially on those connected with multivariate response, include the work of Baghfalaki et al [108], Huang and Dagne [109], Chang and Zimmerman [110], and Jana et al [111].…”
Section: Methods For Biostatistics and Medical Statisticsmentioning
confidence: 99%
See 1 more Smart Citation
“…A substantial number of contributions in this domain has been summarized by Azzalini and Capitanio [7] (pp. [218][219][220], and (also for space reasons) we do not reproduce them here. More recent contributions, focusing especially on those connected with multivariate response, include the work of Baghfalaki et al [108], Huang and Dagne [109], Chang and Zimmerman [110], and Jana et al [111].…”
Section: Methods For Biostatistics and Medical Statisticsmentioning
confidence: 99%
“…Zadkarami and Rowhani [218] uses the SN in a discriminant analysis to classify the pixels of a remotely sensed satellite image. Balef et al [219] use the log SN distribution to model delay variation for supply voltages in an electricity network. Tsai and Lin [220] use a non-linear SN model and develop procedures to assess the reliability information of products in which quality degrades over time.…”
Section: Industrial and Technological Applicationsmentioning
confidence: 99%
“…According to [17], LSN distribution is suggested for the modeling of the delay distribution and shows remarkable accuracy in the near-threshold region. Therefore, X is assumed skew-normal distribution, the distribution parameters are ε, ω and λ, and the basic propertied of SN and LSN are introduced in Section 2.…”
Section: Moment Matchingmentioning
confidence: 99%
“…For near-threshold region, Balef et al [17] use log-skew-normal (LSN) distribution to model the delay distribution across all voltage regions with its distribution parameters determined by fitting from the Monte Carlo (MC) samples. But it does not reveal the relationship with the process parameters and the environment parameters and takes numerous MC simulations.…”
Section: Introductionmentioning
confidence: 99%