INTRODUCTIONThe Zn x Cd 1Ϫx Se alloy has been of great interest due to its potential applications in blue-green lasers and light emitting diodes. In the past years, attention in this regard was mainly paid to the growth and the study of Zn x Cd 1Ϫx Se low-dimensional structures, 1 while little attention was paid to Zn x Cd 1Ϫx Se epilayers. 2 The growth of Zn x Cd 1Ϫx Se epilayers on a GaAs substrate showed that the alloy concentration in the epilayers is difficult to control when the growth method is organometallic vapor-phase epitaxy (OMVPE) 3,4 but not difficult to control when the method is molecular beam epitaxy. 5 Recently, our growth of Zn x Cd 1Ϫx Se alloys on an InP substrate at 360°C by OMVPE showed that, despite a variation of growth parameters in a wide range, the alloy concentration does not change as we expected and is more likely to be found at x ϳ 0, 0.25, 0.5, 0.75, or 1. 6 Transmission electron microscopy (TEM) measurements showed that compositionally modulated (CM) superlattices have been formed at some places in these epilayers. 7 The TEM results suggest that the unusual alloy compositions at certain x values might be related to the spontaneous formation of a CM superlattice during the OMVPE growth. In fact, spontaneous formation of a CM superlattice has been observed in many III-V alloys and is being actively investigated due to the interests in their selforganized nature and their novel optical properties. 8,9 In this article, the photoluminescence (PL) properties of these alloys were studied. We found that, due to the partial existence of a CM superlattice in the epilayer and the smaller bandgap of the CM superlattice (relative to the normal random alloy), 8,9 the PL of the epilayer shows an anomalous red shift with a decrease in temperature and a large blue shift with an increase in excitation power. We propose a simple two-level model to quantitatively interpret the experimental observations. The structural and optical properties of organometallic vapor-phase epitaxial (OMVPE) grown Zn x Cd 1Ϫx Se epilayers on the (001) InP substrate were studied by transmission electron microscopy (TEM) and photoluminescence (PL). The TEM results showed the spontaneous formation of compositionally modulated (CM) superlattices along the [110] direction with a period of ϳ 10-20 nm at some places in the epilayer. In the PL measurements, we found an anomalous red shift of PL with a decrease in temperature (from 170 K to 100 K) and a large blue shift up to 40 meV with an increase in excitation power. We suggested that the anomalous red shift of PL is caused by a localization of photoexcited carriers from places containing a normal random alloy to places containing a CM superlattice, which has a narrower bandgap, and the large blue shift is caused by a saturation of energy states in the CM superlattice under high excitation. The narrower bandgap of the CM superlattice is supported by a polarized PL study, where the low energy part of PL is strongly polarized along the [110] direction, is consistent with the re...