IEEE International Workshop on Defect and Fault Tolerance in VLSI Systems
DOI: 10.1109/dftvs.1994.630040
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Alternative approaches to fault detection in FSMs

Abstract: ISBN: 0818663073This paper addresses the detection of permanent or transient faults in complex VLSI circuits, with a particular focus on faults leading to sequencing errors. On-line test devices are automatically generated by a specific synthesis tool (ASYL-SdF), avoiding design time overhead. Two approaches based on control-flow checking methods are available to the designer and it is shown that each of these approaches leads, in some cases, to the cheapest implementation. In particular, noticeable gains can … Show more

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Cited by 7 publications
(1 citation statement)
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“…Besides, the error detection latency is nonzero. (An alternate approach has been reported in [14] where explicit signature adjustments are used instead of the state codes leading to implicit adjustments). For the self-monitoring technique in [7], the error detection latency can be made zero by choosing appropriate labels to generate the state codes.…”
Section: Inadequacy Of the Previous Methodsmentioning
confidence: 99%
“…Besides, the error detection latency is nonzero. (An alternate approach has been reported in [14] where explicit signature adjustments are used instead of the state codes leading to implicit adjustments). For the self-monitoring technique in [7], the error detection latency can be made zero by choosing appropriate labels to generate the state codes.…”
Section: Inadequacy Of the Previous Methodsmentioning
confidence: 99%