In this paper, the development of the modified physical vapor transport (M-PVT) method for SiC bulk crystal growth is reviewed. For this technique, elements from CVD are combined with the conventional PVT (physical vapor transport) method to achieve a better process and particularly dopant control. To this end, an additional gas flow is introduced directly into the growth chamber of a PVT growth system. For stable crystal growth it is important that the additional gas flow is of the same order of magnitude as the SiC-species flow by sublimation. Doping experiments resulted in phosphorous concentrations up to 1.5 × 10 18 cm -3 and aluminum concentrations up to 1.3 × 10 20 cm -3 using a PH 3 -flow and a solid aluminum source in an external reservoir as dopant source, respectively. Also, the growth of a crystal with alternating p-and n-type regions for the investigation of the charge carrier-dependant dislocation evolution in SiC is presented to illustrate the outstanding flexibility that is offered by the M-PVT method.