2010
DOI: 10.1063/1.3533664
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Ambipolar diffusion of photoexcited carriers in bulk GaAs

Abstract: The ambipolar carrier diffusion in bulk GaAs is studied by using an ultrafast pump-probe technique with a high spatial resolution. Carriers with a point-like spatial profile are excited by a tightly focused pump laser pulse. The spatiotemporal dynamics of the carriers are monitored by a time-delayed and spatially scanned probe pulse. Ambipolar diffusion coefficients are deduced from linear fits to the expansion of the area of the profiles, and are found to decrease from about 170 cm 2 s −1 at 10 K to about 20 … Show more

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Cited by 79 publications
(58 citation statements)
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“…A spatial Fourier analysis indicates the presence of grains up to 500 nm in diameter, with a mean grain size of 250 nm. The observation of L D ∼4 × larger than the mean grain diameter, together with the fact that this ambipolar diffusion length is limited by the slower carrier species, 42 indicates that grain boundaries do not constitute a significant barrier to carrier motion. This result is in agreement with recent measurements on solution processed CH 3 NH 3 PbI 3 using AC Photo Hall 25 and photocurrent imaging techniques 26 as well as theoretical calculations suggesting that the most prevalent point defects represent shallow traps and that grain boundaries have a relatively benign effect.…”
Section: −1 S Is Plotted Versus 8πmentioning
confidence: 98%
See 1 more Smart Citation
“…A spatial Fourier analysis indicates the presence of grains up to 500 nm in diameter, with a mean grain size of 250 nm. The observation of L D ∼4 × larger than the mean grain diameter, together with the fact that this ambipolar diffusion length is limited by the slower carrier species, 42 indicates that grain boundaries do not constitute a significant barrier to carrier motion. This result is in agreement with recent measurements on solution processed CH 3 NH 3 PbI 3 using AC Photo Hall 25 and photocurrent imaging techniques 26 as well as theoretical calculations suggesting that the most prevalent point defects represent shallow traps and that grain boundaries have a relatively benign effect.…”
Section: −1 S Is Plotted Versus 8πmentioning
confidence: 98%
“…A third delayed pulse E 3 (t-(τ+T)), was used to probe the grating modulation depth by monitoring the diffracted signal as a function of time delay T between pulses E 2 and E 3 . Provided carrier transport is diffusive, 40,42 the FWM signal decays exponentially versus T, 40,41 with the signal intensity proportional to:…”
mentioning
confidence: 99%
“…Although ambipolar diffusion for band gap excitation into the Γ valley of GaAs has been studied [62,63], here we have to consider the case with a large transient population of carriers in the L and X valleys. In addition, the highest mobilities are typically known for undoped, semi-insulating material and the mobility drops greatly with doping due to ionized impurity scattering.…”
Section: Carrier Ambipolar Diffusionmentioning
confidence: 99%
“…After the initial work on electrostatic coupling between electrons and holes 1 , significant theoretical and experimental work has been published on ambipolar diffusion in bulk materials 2,3 as well as in heterostructures 4,5 . The majority of recent studies consider undoped material so that the ambipolar diffusion constant is only related to hole diffusion [6][7][8] or to excitonic transport 9 . The dependence of the ambipolar diffusion constant, D a = (D n σ p + D p σ n )/(σ p + σ n ), on the unipolar diffusion constant D n (D p ) of electrons (holes) and of their partial conductivities σ n (σ p ) has never been detailed experimentally.…”
Section: Introductionmentioning
confidence: 99%