2014
DOI: 10.1007/s13391-013-3099-x
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Ammonium sulfide surface treatment of electrodeposited p-type cuprous oxide thin films

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Cited by 15 publications
(19 citation statements)
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“…However, evidence of using sulfur treatment to passivate the Cu 2 O film surfaces is not available in literature even though cyanides and hydrogen have been used for the passivation of p‐type Cu 2 O film surfaces 13, 14. Recently, we have demonstrated the use of (NH 4 ) 2 S assisted sulfur treatment for the enhancement of optical and electrical properties of p‐type Cu 2 O thin films 15. Similar experiments were carried out in order to study the effect of sulfur treatment on n‐type Cu 2 O thin films fabricated using electrodeposition.…”
Section: Motivationmentioning
confidence: 99%
“…However, evidence of using sulfur treatment to passivate the Cu 2 O film surfaces is not available in literature even though cyanides and hydrogen have been used for the passivation of p‐type Cu 2 O film surfaces 13, 14. Recently, we have demonstrated the use of (NH 4 ) 2 S assisted sulfur treatment for the enhancement of optical and electrical properties of p‐type Cu 2 O thin films 15. Similar experiments were carried out in order to study the effect of sulfur treatment on n‐type Cu 2 O thin films fabricated using electrodeposition.…”
Section: Motivationmentioning
confidence: 99%
“…To passivate the film surfaces, (NH 4 ) 2 S vapor treatment was used by simply holding the Cu 2 O film face down above a beaker containing 20 vol% (NH 4 ) 2 S solution for n‐type and 50 vol% (NH 4 ) 2 S solution for p‐type at 27 °C, followed by rinsing immediately with distilled water. Detailed experimental procedure has been discussed elsewhere . In order to make the spectral response measurements, all sulfur‐treated Cu 2 O thin films were investigated in a three electrode photoelectrochemical cell containing a 0.1 M sodium acetate solution.…”
Section: Methodsmentioning
confidence: 99%
“…Some of the key issues that need to be addressed in Cu 2 O thin film solar cell development is the associated high resistivity and defects of the Cu 2 O thin films. For device applications, especially, the minimization of surface defects such as those due to dangling bonds and nonradiative recombination centers in the Cu 2 O films is of utmost importance because it causes to reduce resistivity and enhance the electrical and optical properties . An obvious approach to modify surface and interface properties of semiconductors is to make the surface interact with foreign atoms, e.g., sulfur , selenium , chlorine , or simple radicals, e.g., cyanides .…”
Section: Introductionmentioning
confidence: 99%
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