Strontium-doped Cu 2 O thin films were successfully grown through metalorganic chemical vapor deposition method. The films were characterized regarding their morphology, composition, electrical, and optical properties. The composition of the films, and especially their strontium concentration, is the dominant factor which mainly affects the morphology as well as the electrical film properties. Indeed, it was observed that an increase of the film strontium content decreases its resistivity, from 10 5 V cm for undoped Cu 2 O films to about 10 1 V cm for films doped with 5-6% strontium without any impact on their optical properties. However, for larger strontium contents, the Cu 2 O films also contain SrCO 3 as impurity phase.