2010
DOI: 10.1016/j.jnoncrysol.2010.09.073
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Amorphous niobium oxide thin films

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Cited by 88 publications
(55 citation statements)
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“…This finding does not generally contradict to a previous work by Habazaki and co-workers, 36 reporting that, during the anodizing of Al superimposed on Nb in barrier-type electrolytes, randomly 5 occurring NO nano-needles penetrate and irregularly mix with the upper alumina. However, the findings of our work reveal clearly that the ionic transport and anodic oxide growth become increasingly systematic when the Nb metal is reanodized through the alumina nanopores, which determine the local spots for 10 nucleation and growth of the NO nanocolumns. The enlarged and fully solid (root-free) tops of the NO protrusions (see also Figure 2c) result from merging the sub-nanochannels into a relatively wider pathway (Figure 8c), which is believed to happen because of the beginning of oxide growth inside the pores and the ion 15 migration within the outer part of the alumina cell walls.…”
Section: The Model Of Film Growthmentioning
confidence: 76%
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“…This finding does not generally contradict to a previous work by Habazaki and co-workers, 36 reporting that, during the anodizing of Al superimposed on Nb in barrier-type electrolytes, randomly 5 occurring NO nano-needles penetrate and irregularly mix with the upper alumina. However, the findings of our work reveal clearly that the ionic transport and anodic oxide growth become increasingly systematic when the Nb metal is reanodized through the alumina nanopores, which determine the local spots for 10 nucleation and growth of the NO nanocolumns. The enlarged and fully solid (root-free) tops of the NO protrusions (see also Figure 2c) result from merging the sub-nanochannels into a relatively wider pathway (Figure 8c), which is believed to happen because of the beginning of oxide growth inside the pores and the ion 15 migration within the outer part of the alumina cell walls.…”
Section: The Model Of Film Growthmentioning
confidence: 76%
“…5 This eventually confirms the presence of Al and Si in the column material and shows the degree of filing the pores by the niobium oxide. The high-resolution TEM images of fragments of the lamella are shown in Figure 6d, g, and h. On these images, the round spots are the areas impacted by the Ga ions used for 10 sputtering the sample surface in the FIB technique employed here. Three regions (a, b, and c) with dissimilar physical properties are well distinguished within the column section, the interpretation is given later in the text.…”
Section: Film Compositionmentioning
confidence: 99%
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“…NbC niobium carbides (Figure 5b) exhibit the best electrochemical performance, in part because they constitute the system that has a lower degree of porosity, and also because the metal oxide Nb 2 O 5 has excellent chemical stability and corrosion resistance in acidic and basic media [22].…”
Section: Electrochemical Performancementioning
confidence: 99%