2019
DOI: 10.3390/s19204510
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Amplitude Dependence of Resonance Frequency and its Consequences for Scanning Probe Microscopy

Abstract: With recent advances in scanning probe microscopy (SPM), it is now routine to determine the atomic structure of surfaces and molecules while quantifying the local tip-sample interaction potentials. Such quantitative experiments using noncontact frequency modulation atomic force microscopy is based on the accurate measurement of the resonance frequency shift due to the tip-sample interaction. Here, we experimentally show that the resonance frequency of oscillating probes used for SPM experiments change systemat… Show more

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Cited by 7 publications
(8 citation statements)
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“…This discrepancy could be attributed either to imperfect bonding between one prong of the qPlus and the supporting wall (Figure 1b), or to the base of the qPlus partially covered with glue. While our model is linear, the nonlinearity shown by Dagdeviren et al [20] could be partially responsible for the discrepancy in Figure 5; the resonance frequency of oscillating probes can change by a few hertz when changing the oscillation amplitude by nearly two orders of magnitude. In addition, one could derive more accurate formulas for U1 and U2 (Equations (11) and (12)) to reduce the difference.…”
Section: Theory and Analysismentioning
confidence: 56%
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“…This discrepancy could be attributed either to imperfect bonding between one prong of the qPlus and the supporting wall (Figure 1b), or to the base of the qPlus partially covered with glue. While our model is linear, the nonlinearity shown by Dagdeviren et al [20] could be partially responsible for the discrepancy in Figure 5; the resonance frequency of oscillating probes can change by a few hertz when changing the oscillation amplitude by nearly two orders of magnitude. In addition, one could derive more accurate formulas for U1 and U2 (Equations (11) and (12)) to reduce the difference.…”
Section: Theory and Analysismentioning
confidence: 56%
“…The electrical responses of the ED-TF (Figure 1a) and ED-qPlus (Figure 1b) are described well by the equivalent circuit model shown in Figure 1c. Note that the equivalent circuit describes the linear motion of a TF or qPlus, although a recent study showed the amplitude dependence of the resonance frequency in such quartz resonators [20]. Therefore, one should consider the nonlinearity when using a quartz sensor to quantify the tip–sample interaction potentials and forces with milli-electron volt and pico-Newton resolutions [20].…”
Section: Methodsmentioning
confidence: 99%
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“…The uniform distribution of the homogeneous particles was registered for CoZrO 2 (Figure a), and it is consistent with the histogram (Figure b) showing the distribution of size (around 80–160 nm) of zirconia particles. It means that a maximum size (135 nm) was registered and observing no amplitude error in the mapping (Figure c). , The same observations were noted for LiZrO 2 and MgZrO 2 (see Figure S1).…”
Section: Resultsmentioning
confidence: 99%
“…It means that a maximum size (135 nm) was registered and observing no amplitude error in the mapping (Figure 5c). 46,47 The same observations were noted for LiZrO 2 and MgZrO 2 (see Figure S1).…”
Section: Atomic Force Microscopymentioning
confidence: 96%