2017
DOI: 10.1016/j.sse.2017.02.005
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An accurate model for predicting high frequency noise of nanoscale NMOS SOI transistors

Abstract: A nonlinear and scalable model suitable for predicting high frequency noise of N-type Metal Oxide Semiconductor (NMOS) transistors is presented. The model is developed for a commercial 45 nm CMOS SOI technology and its accuracy is validated through comparison with measured performance of a microwave low noise amplifier. The model employs the virtual source nonlinear core and adds parasitic elements to accurately simulate the RF behavior of multi-finger NMOS transistors up to 40 GHz. For the first time, the tra… Show more

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Cited by 7 publications
(2 citation statements)
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“…At the same time, on the nanoscale, measurements of electrical noise and fluctuations become powerful and a useful way of accurately extracting valuable signals from the nanodevice being tested. [7,8,32,33] The most common component of the main noise spectrum of any device structure is known to be 1/f flicker noise. In the case of structures containing semiconductor and dielectric materials, the flicker noise is usually caused by the interaction between charge carriers and traps at the Si/SiO 2 interface.…”
Section: Resultsmentioning
confidence: 99%
“…At the same time, on the nanoscale, measurements of electrical noise and fluctuations become powerful and a useful way of accurately extracting valuable signals from the nanodevice being tested. [7,8,32,33] The most common component of the main noise spectrum of any device structure is known to be 1/f flicker noise. In the case of structures containing semiconductor and dielectric materials, the flicker noise is usually caused by the interaction between charge carriers and traps at the Si/SiO 2 interface.…”
Section: Resultsmentioning
confidence: 99%
“…An issue of employee participation in the area of OHS was raised by researchers but only as a minor element of occupational health and safety management (Bayram, 2020;Mirza et al, 2022;Zhao et al, 2022;Erbaş, 2022;Tear et al, 2020;Hu et al, 2020;Lee et al, 2019;Ghahramani & Salminen, 2019;Skład, 2019;Lyu et al, 2018Shen et al, 2017;Hrenov et al, 2017;Cooper, 2015;Skeepers & Mbohwa, 2015;Masso, 2015;Paas et al, 2015aPaas et al, , 2015bVinodkumar & Bhasi, 2011;Coutrot, 2009;Walters & Nichols, 2007;Mygind et al, 2006;Butler & Park, 2005;Reilly et al, 1995;Gevers, 1983). Researchers also analyse the aspect of employee participation in occupational health and safety as one of the many dimensions building a safety culture (Znajmiecka et al, 2022;Tear et al, 2020).…”
Section: Literature Reviewmentioning
confidence: 99%